[PATCH v2 1/2] pwm: samsung: Fix a bit test in pwm_samsung_resume()

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The PWMF_REQUESTED enum is supposed to be used with test_bit() and not
used as in a bitwise AND.  In this specific code the flag will never be
set so the function is effectively a no-op.

Fixes: e3fe982b2e4e ("pwm: samsung: Put per-channel data into driver data")
Signed-off-by: Dan Carpenter <dan.carpenter@xxxxxxxxxx>
---
v2: Split the patch into two parts

 drivers/pwm/pwm-samsung.c | 2 +-
 1 file changed, 1 insertion(+), 1 deletion(-)

diff --git a/drivers/pwm/pwm-samsung.c b/drivers/pwm/pwm-samsung.c
index 568491ed6829..69d9f4577b34 100644
--- a/drivers/pwm/pwm-samsung.c
+++ b/drivers/pwm/pwm-samsung.c
@@ -631,7 +631,7 @@ static int pwm_samsung_resume(struct device *dev)
 		struct pwm_device *pwm = &chip->pwms[i];
 		struct samsung_pwm_channel *chan = &our_chip->channel[i];
 
-		if (!(pwm->flags & PWMF_REQUESTED))
+		if (!test_bit(PWMF_REQUESTED, &pwm->flags))
 			continue;
 
 		if (our_chip->variant.output_mask & BIT(i))
-- 
2.42.0




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