******************************************************** From: John Fournelle <johnf@xxxxxxxxxxxxxxxx> ******************************************************** V38 Challenges to Electron Microprobe Analysis in Geology 2008 will be the 50th anniversary of the first commercial electron microprobe (MS85). A lot has changed, and a lot hasn't. In electron microprobe microanalysis (EPMA), we still struggle to produce "good results" with highly automated machines and fast computers. This session will address some of the continuing challenges of EPMA: evaluating standards, recognizing peak shifts in Al, Mg and Si, correcting for secondary fluorescence (e.g. for trace-element EPMA), dealing with element volatility, problems with conductivity and particularly problems with EPMA of ____ (feldspar, garnet, carbonate, ilmenite, glass -- fill in your favorite material here). If the electron microprobe is one of your primary tools for data on minerals and glasses, take this opportunity to discuss those challenging samples you might have. Conveners: John Fournelle, University of Wisconsin-Madison, johnf@xxxxxxxxxxxxxxxx John Donovan, CAMCOR/University of Oregon, donovan@xxxxxxxxxxx Paul Carpenter, Washington University, paulc@xxxxxxxxxxxxxxx ============================================================== To unsubscribe from the volcano list, send the message: signoff volcano to: listserv@xxxxxxx, or write to: volcano-request@xxxxxxxx To contribute to the volcano list, send your message to: volcano@xxxxxxxx Please do not send attachments. ==============================================================
