On Mon, 24 Sep 2018 10:30:47 +0200 Daniel Mack <daniel@xxxxxxxxxx> wrote: > >> Interestingly, I can't seem to reproduce the bug with any of the mtd > >> kernel tests, I've tried all of them, several times, and all succeed. So > >> a file system test that includes the UBI/UBIFS layers seems to trigger > >> different things in the driver than the the tests that operate on the > >> mtd device directly. > > > > Looking at the backtrace, it seems to fail on a high PEB num. Are you > > interfacing with a dual-die chip? Can you share the part number of your > > chip? > > The chip is a NAND01GR3B2BZA which is identified like this during probe: Okay, so it's definitely not caused by a missing R/B pin on a multi-die chip (this chip only has one die). ______________________________________________________ Linux MTD discussion mailing list http://lists.infradead.org/mailman/listinfo/linux-mtd/