On Fri, 29 Sep 2023 12:23:27 -0500 David Lechner <dlechner@xxxxxxxxxxxx> wrote: > From: David Lechner <david@xxxxxxxxxxxxxx> > > From: David Lechner <dlechner@xxxxxxxxxxxx> > > The AD2S1210 has a programmable threshold for the loss of signal (LOS) > fault. This fault is triggered when either the sine or cosine input > falls below the threshold voltage. > > This patch converts the custom device LOS threshold attribute to an > event falling edge threshold attribute on a new monitor signal channel. > The monitor signal is an internal signal that combines the amplitudes > of the sine and cosine inputs as well as the current angle and position > output. This signal is used to detect faults in the input signals. > > The attribute now uses millivolts instead of the raw register value in > accordance with the IIO ABI. > > Emitting the event will be implemented in a later patch. > > Signed-off-by: David Lechner <dlechner@xxxxxxxxxxxx> I think I'm fine with treating these internal signals like this, but I would ideally like someone from Analog devices to take a look at how these are being done and make sure our interpretations of the signals make sense to them. We are pushing the boundaries a little here (though we have done similar before for fault events I think.) Jonathan
