From: Jonathan Cameron <Jonathan.Cameron@xxxxxxxxxx> in_ only occurs once in these attributes. Signed-off-by: Jonathan Cameron <Jonathan.Cameron@xxxxxxxxxx> --- Documentation/ABI/testing/sysfs-bus-iio | 2 +- 1 file changed, 1 insertion(+), 1 deletion(-) diff --git a/Documentation/ABI/testing/sysfs-bus-iio b/Documentation/ABI/testing/sysfs-bus-iio index 3e00d7f7ee22..d3a0c0ef8948 100644 --- a/Documentation/ABI/testing/sysfs-bus-iio +++ b/Documentation/ABI/testing/sysfs-bus-iio @@ -193,7 +193,7 @@ Description: Raw capacitance measurement from channel Y. Units after application of scale and offset are nanofarads. -What: /sys/.../iio:deviceX/in_capacitanceY-in_capacitanceZ_raw +What: /sys/.../iio:deviceX/in_capacitanceY-capacitanceZ_raw KernelVersion: 3.2 Contact: linux-iio@xxxxxxxxxxxxxxx Description: -- 2.36.1
