Hello, Sorry for the noise, but I forgot to add DT maintainers in Cc. This series aims at standardizing a feature already supported by some NAND controller drivers: setting the maximum ECC strength based on the OOB area size instead of using the ECC strength/step_size information retrieved from the DT or NAND detection code. This is particularly useful when the NAND device is used in by a FS/wear-leveling layer that is not using the OOB area at all (this is the case of UBI). Note that drivers already implementing this kind of logic are not converted to the new approach (because of backward compatibility concern), but new drivers or drivers that do not already implement this 'ECC maximization' logic are encouraged to do it. Regards, Boris Boris Brezillon (3): mtd: nand: Add an option to maximize the ECC strength mtd: nand: Support maximizing ECC when using software BCH mtd: nand: sunxi: Support ECC maximization Documentation/devicetree/bindings/mtd/nand.txt | 9 ++++++++ drivers/mtd/nand/nand_base.c | 23 ++++++++++++++++++++ drivers/mtd/nand/sunxi_nand.c | 29 ++++++++++++++++++++++++++ include/linux/mtd/nand.h | 1 + 4 files changed, 62 insertions(+) -- 2.7.4 -- To unsubscribe from this list: send the line "unsubscribe devicetree" in the body of a message to majordomo@xxxxxxxxxxxxxxx More majordomo info at http://vger.kernel.org/majordomo-info.html
