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AGU 2010 Session: V29 Microanalysis in Geoscience: Advances and Challenges
From: Brian Jicha <bjicha@xxxxxxxxxxxxxxxx>
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You are invited to submit an abstract to the "Microanalysis in Geoscience: Advances and Challenges" session at the AGU Fall Meeting Dec 13-17 meeting in San Francisco.
V29: Microanalysis in Geoscience: Advances and Challenges
Description: Advances in microanalytic technology and instrumentation have given geoscientists new possibilities in examining earth materials. Low kV electron probe microanalysis with field emission guns, femto-second lasers, more versatile CL detectors, high precision Ar/Ar mass spectrometry for geochronology, EBSD-detectors hooked to SEMs, and improved SIMS analysis of smaller volumes, to name some. Challenges exist, e.g. interpreting and quantifying the results. There is an increasing need for development of well characterized standards. Sample preparation may be a stumbling block (e.g. EBSD). We particularly invite abstracts which document unresolved problems. Co-sponsor: Microbeam Analysis Society
The deadline for abstracts is Sept 2 (online site for submissions opens July 21).
Conveners
John Fournelle, University of Wisconsin, johnf@xxxxxxxxxxxxxxxx
Brian Jicha, University of Wisconsin, bjicha@xxxxxxxxxxxxxxxx
Heather Lowers, USGS, hlowers@xxxxxxxx
Alan Koenig, USGS, akoenig@xxxxxxxx
Please contact any of the conveners for more information. Thank you.
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