Re: RAID5 broke during reshape...

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Dnia 2010-01-02, sob o godzinie 20:33 +0300, Majed B. pisze:
> Post the output of mdadm -E /dev/sdx1 and smart -a /dev/sdx for all
> disks.

Please find the files attached.

> Also, which version of mdadm are you using? 

media ~ # mdadm --version
mdadm - v3.1.1 - 19th November 2009


-- 
Pozdrawiam
Michał (Saviq) Sawicz

/dev/sdc1:
          Magic : a92b4efc
        Version : 1.1
    Feature Map : 0x0
     Array UUID : 7b3ab381:fd5dde20:9b116480:c5425916
           Name : media:5  (local to host media)
  Creation Time : Sat Dec 19 12:14:40 2009
     Raid Level : raid5
   Raid Devices : 4

 Avail Dev Size : 1953519738 (931.51 GiB 1000.20 GB)
     Array Size : 5860558848 (2794.53 GiB 3000.61 GB)
  Used Dev Size : 1953519616 (931.51 GiB 1000.20 GB)
    Data Offset : 264 sectors
   Super Offset : 0 sectors
          State : clean
    Device UUID : fbdd8977:5c6a0b13:f1f792cb:6039ee70

    Update Time : Sat Jan  2 17:48:04 2010
       Checksum : efc67930 - correct
         Events : 488034

         Layout : left-symmetric
     Chunk Size : 256K

   Device Role : Active device 0
   Array State : A.A. ('A' == active, '.' == missing)

===============================================================================

=== START OF INFORMATION SECTION ===
Device Model:     SAMSUNG HD103UJ
Serial Number:    S1B9JDWS303240
Firmware Version: 1AA01114
User Capacity:    1,000,204,886,016 bytes
Device is:        In smartctl database [for details use: -P show]
ATA Version is:   8
ATA Standard is:  ATA-8-ACS revision 3b
Local Time is:    Sat Jan  2 18:47:34 2010 CET

==> WARNING: May need -F samsung or -F samsung2 enabled; see manual for details.

SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x00)	Offline data collection activity
					was never started.
					Auto Offline Data Collection: Disabled.
Self-test execution status:      (   0)	The previous self-test routine completed
					without error or no self-test has ever 
					been run.
Total time to complete Offline 
data collection: 		 (12114) seconds.
Offline data collection
capabilities: 			 (0x7b) SMART execute Offline immediate.
					Auto Offline data collection on/off support.
					Suspend Offline collection upon new
					command.
					Offline surface scan supported.
					Self-test supported.
					Conveyance Self-test supported.
					Selective Self-test supported.
SMART capabilities:            (0x0003)	Saves SMART data before entering
					power-saving mode.
					Supports SMART auto save timer.
Error logging capability:        (0x01)	Error logging supported.
					General Purpose Logging supported.
Short self-test routine 
recommended polling time: 	 (   2) minutes.
Extended self-test routine
recommended polling time: 	 ( 203) minutes.
Conveyance self-test routine
recommended polling time: 	 (  22) minutes.
SCT capabilities: 	       (0x003f)	SCT Status supported.
					SCT Feature Control supported.
					SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x000f   100   100   051    Pre-fail  Always       -       0
  3 Spin_Up_Time            0x0007   077   077   011    Pre-fail  Always       -       7860
  4 Start_Stop_Count        0x0032   100   100   000    Old_age   Always       -       21
  5 Reallocated_Sector_Ct   0x0033   100   100   010    Pre-fail  Always       -       0
  7 Seek_Error_Rate         0x000f   100   100   051    Pre-fail  Always       -       0
  8 Seek_Time_Performance   0x0025   100   100   015    Pre-fail  Offline      -       0
  9 Power_On_Hours          0x0032   099   099   000    Old_age   Always       -       3622
 10 Spin_Retry_Count        0x0033   100   100   051    Pre-fail  Always       -       0
 11 Calibration_Retry_Count 0x0012   100   100   000    Old_age   Always       -       0
 12 Power_Cycle_Count       0x0032   100   100   000    Old_age   Always       -       21
 13 Read_Soft_Error_Rate    0x000e   100   100   000    Old_age   Always       -       0
183 Unknown_Attribute       0x0032   100   100   000    Old_age   Always       -       0
184 Unknown_Attribute       0x0033   100   100   000    Pre-fail  Always       -       0
187 Reported_Uncorrect      0x0032   100   100   000    Old_age   Always       -       0
188 Unknown_Attribute       0x0032   100   100   000    Old_age   Always       -       0
190 Airflow_Temperature_Cel 0x0022   068   058   000    Old_age   Always       -       32 (Lifetime Min/Max 26/38)
194 Temperature_Celsius     0x0022   068   056   000    Old_age   Always       -       32 (Lifetime Min/Max 26/39)
195 Hardware_ECC_Recovered  0x001a   100   100   000    Old_age   Always       -       139150990
196 Reallocated_Event_Count 0x0032   100   100   000    Old_age   Always       -       0
197 Current_Pending_Sector  0x0012   100   100   000    Old_age   Always       -       0
198 Offline_Uncorrectable   0x0030   100   100   000    Old_age   Offline      -       0
199 UDMA_CRC_Error_Count    0x003e   100   100   000    Old_age   Always       -       8
200 Multi_Zone_Error_Rate   0x000a   100   100   000    Old_age   Always       -       0
201 Soft_Read_Error_Rate    0x000a   100   100   000    Old_age   Always       -       0

SMART Error Log Version: 1
ATA Error Count: 3
	CR = Command Register [HEX]
	FR = Features Register [HEX]
	SC = Sector Count Register [HEX]
	SN = Sector Number Register [HEX]
	CL = Cylinder Low Register [HEX]
	CH = Cylinder High Register [HEX]
	DH = Device/Head Register [HEX]
	DC = Device Command Register [HEX]
	ER = Error register [HEX]
	ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 3 occurred at disk power-on lifetime: 0 hours (0 days + 0 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  04 53 02 3f 00 00 e0  Error: ABRT at LBA = 0x0000003f = 63

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  ca 00 02 3f 00 00 e0 00   9d+06:59:21.580  WRITE DMA
  ea 00 00 46 65 eb a0 00   9d+06:59:21.570  FLUSH CACHE EXIT
  ea 00 00 40 00 00 a0 00   9d+06:59:20.750  FLUSH CACHE EXIT
  ca 00 02 3f 00 00 e0 00   9d+06:59:20.750  WRITE DMA
  ea 00 00 c6 a2 c2 a0 00   9d+06:59:20.750  FLUSH CACHE EXIT

Error 2 occurred at disk power-on lifetime: 0 hours (0 days + 0 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  04 53 30 ee d5 53 e0  Error: ABRT at LBA = 0x0053d5ee = 5494254

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  ca 00 30 ee d5 53 e0 00   2d+00:26:37.390  WRITE DMA
  ca 00 08 66 72 3b e0 00   2d+00:26:37.390  WRITE DMA
  ca 00 08 56 72 3b e0 00   2d+00:26:37.390  WRITE DMA
  ea 00 00 4d 79 b1 a0 00   2d+00:26:37.340  FLUSH CACHE EXIT
  ca 00 08 46 79 b1 e0 00   2d+00:26:37.340  WRITE DMA

Error 1 occurred at disk power-on lifetime: 0 hours (0 days + 0 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  04 53 08 46 79 b1 e0  Error: ABRT at LBA = 0x00b17946 = 11630918

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  ca 00 08 46 79 b1 e0 00   3d+00:04:16.140  WRITE DMA
  ea 00 00 2b 1a c2 a0 00   3d+00:04:16.140  FLUSH CACHE EXIT
  c8 00 08 c4 1b 53 ec 00   3d+00:04:16.120  READ DMA
  c8 00 10 2e d3 12 e0 00   3d+00:04:16.070  READ DMA
  ca 00 30 16 34 54 e0 00   3d+00:04:15.830  WRITE DMA

SMART Self-test log structure revision number 1
No self-tests have been logged.  [To run self-tests, use: smartctl -t]


SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

/dev/sdf1:
          Magic : a92b4efc
        Version : 1.1
    Feature Map : 0x0
     Array UUID : 7b3ab381:fd5dde20:9b116480:c5425916
           Name : media:5  (local to host media)
  Creation Time : Sat Dec 19 12:14:40 2009
     Raid Level : raid5
   Raid Devices : 4

 Avail Dev Size : 1953519738 (931.51 GiB 1000.20 GB)
     Array Size : 5860558848 (2794.53 GiB 3000.61 GB)
  Used Dev Size : 1953519616 (931.51 GiB 1000.20 GB)
    Data Offset : 264 sectors
   Super Offset : 0 sectors
          State : clean
    Device UUID : 5d5eda8d:0a511d8f:b5cbdfc1:62553e46

    Update Time : Sat Jan  2 17:48:04 2010
       Checksum : 4dc5d008 - correct
         Events : 488034

         Layout : left-symmetric
     Chunk Size : 256K

   Device Role : spare
   Array State : A.A. ('A' == active, '.' == missing)

===============================================================================

=== START OF INFORMATION SECTION ===
Device Model:     SAMSUNG HD103UJ
Serial Number:    S13PJ1KS504152
Firmware Version: 1AA01118
User Capacity:    1,000,204,886,016 bytes
Device is:        In smartctl database [for details use: -P show]
ATA Version is:   8
ATA Standard is:  ATA-8-ACS revision 3b
Local Time is:    Sat Jan  2 18:46:36 2010 CET

==> WARNING: May need -F samsung or -F samsung2 enabled; see manual for details.

SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x00)	Offline data collection activity
					was never started.
					Auto Offline Data Collection: Disabled.
Self-test execution status:      (   0)	The previous self-test routine completed
					without error or no self-test has ever 
					been run.
Total time to complete Offline 
data collection: 		 (13597) seconds.
Offline data collection
capabilities: 			 (0x7b) SMART execute Offline immediate.
					Auto Offline data collection on/off support.
					Suspend Offline collection upon new
					command.
					Offline surface scan supported.
					Self-test supported.
					Conveyance Self-test supported.
					Selective Self-test supported.
SMART capabilities:            (0x0003)	Saves SMART data before entering
					power-saving mode.
					Supports SMART auto save timer.
Error logging capability:        (0x01)	Error logging supported.
					General Purpose Logging supported.
Short self-test routine 
recommended polling time: 	 (   2) minutes.
Extended self-test routine
recommended polling time: 	 ( 227) minutes.
Conveyance self-test routine
recommended polling time: 	 (  24) minutes.
SCT capabilities: 	       (0x003f)	SCT Status supported.
					SCT Feature Control supported.
					SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x000f   100   100   051    Pre-fail  Always       -       0
  3 Spin_Up_Time            0x0007   069   069   011    Pre-fail  Always       -       10070
  4 Start_Stop_Count        0x0032   100   100   000    Old_age   Always       -       47
  5 Reallocated_Sector_Ct   0x0033   100   100   010    Pre-fail  Always       -       0
  7 Seek_Error_Rate         0x000f   100   100   051    Pre-fail  Always       -       0
  8 Seek_Time_Performance   0x0025   100   100   015    Pre-fail  Offline      -       0
  9 Power_On_Hours          0x0032   099   099   000    Old_age   Always       -       4770
 10 Spin_Retry_Count        0x0033   100   100   051    Pre-fail  Always       -       0
 11 Calibration_Retry_Count 0x0012   100   100   000    Old_age   Always       -       1
 12 Power_Cycle_Count       0x0032   100   100   000    Old_age   Always       -       47
 13 Read_Soft_Error_Rate    0x000e   100   100   000    Old_age   Always       -       0
183 Unknown_Attribute       0x0032   100   100   000    Old_age   Always       -       0
184 Unknown_Attribute       0x0033   100   100   000    Pre-fail  Always       -       0
187 Reported_Uncorrect      0x0032   100   100   000    Old_age   Always       -       0
188 Unknown_Attribute       0x0032   100   100   000    Old_age   Always       -       0
190 Airflow_Temperature_Cel 0x0022   066   056   000    Old_age   Always       -       34 (Lifetime Min/Max 28/39)
194 Temperature_Celsius     0x0022   066   055   000    Old_age   Always       -       34 (Lifetime Min/Max 28/41)
195 Hardware_ECC_Recovered  0x001a   100   100   000    Old_age   Always       -       83248080
196 Reallocated_Event_Count 0x0032   100   100   000    Old_age   Always       -       0
197 Current_Pending_Sector  0x0012   100   100   000    Old_age   Always       -       0
198 Offline_Uncorrectable   0x0030   100   100   000    Old_age   Offline      -       0
199 UDMA_CRC_Error_Count    0x003e   100   100   000    Old_age   Always       -       0
200 Multi_Zone_Error_Rate   0x000a   100   100   000    Old_age   Always       -       0
201 Soft_Read_Error_Rate    0x000a   100   100   000    Old_age   Always       -       0

SMART Error Log Version: 1
No Errors Logged

SMART Self-test log structure revision number 1
No self-tests have been logged.  [To run self-tests, use: smartctl -t]


SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
/dev/sdg1:
          Magic : a92b4efc
        Version : 1.1
    Feature Map : 0x0
     Array UUID : 7b3ab381:fd5dde20:9b116480:c5425916
           Name : media:5  (local to host media)
  Creation Time : Sat Dec 19 12:14:40 2009
     Raid Level : raid5
   Raid Devices : 4

 Avail Dev Size : 1953519738 (931.51 GiB 1000.20 GB)
     Array Size : 5860558848 (2794.53 GiB 3000.61 GB)
  Used Dev Size : 1953519616 (931.51 GiB 1000.20 GB)
    Data Offset : 264 sectors
   Super Offset : 0 sectors
          State : clean
    Device UUID : 8e6a9f57:a33fd6eb:eb8514fc:247b362b

    Update Time : Sat Jan  2 17:48:04 2010
       Checksum : 9370aac8 - correct
         Events : 488034

         Layout : left-symmetric
     Chunk Size : 256K

   Device Role : Active device 2
   Array State : A.A. ('A' == active, '.' == missing)

===============================================================================

=== START OF INFORMATION SECTION ===
Device Model:     SAMSUNG HD103UJ
Serial Number:    S13PJ1MSB02027
Firmware Version: 1AA01118
User Capacity:    1,000,204,886,016 bytes
Device is:        In smartctl database [for details use: -P show]
ATA Version is:   8
ATA Standard is:  ATA-8-ACS revision 3b
Local Time is:    Sat Jan  2 18:48:02 2010 CET

==> WARNING: May need -F samsung or -F samsung2 enabled; see manual for details.

SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x00)	Offline data collection activity
					was never started.
					Auto Offline Data Collection: Disabled.
Self-test execution status:      (  17)	The self-test routine was aborted by
					the host.
Total time to complete Offline 
data collection: 		 (13928) seconds.
Offline data collection
capabilities: 			 (0x7f) SMART execute Offline immediate.
					Auto Offline data collection on/off support.
					Abort Offline collection upon new
					command.
					Offline surface scan supported.
					Self-test supported.
					Conveyance Self-test supported.
					Selective Self-test supported.
SMART capabilities:            (0x0003)	Saves SMART data before entering
					power-saving mode.
					Supports SMART auto save timer.
Error logging capability:        (0x01)	Error logging supported.
					General Purpose Logging supported.
Short self-test routine 
recommended polling time: 	 (   2) minutes.
Extended self-test routine
recommended polling time: 	 ( 233) minutes.
Conveyance self-test routine
recommended polling time: 	 (  25) minutes.
SCT capabilities: 	       (0x003f)	SCT Status supported.
					SCT Feature Control supported.
					SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x000f   100   100   051    Pre-fail  Always       -       0
  3 Spin_Up_Time            0x0007   068   068   011    Pre-fail  Always       -       10290
  4 Start_Stop_Count        0x0032   100   100   000    Old_age   Always       -       6
  5 Reallocated_Sector_Ct   0x0033   100   100   010    Pre-fail  Always       -       0
  7 Seek_Error_Rate         0x000f   253   253   051    Pre-fail  Always       -       0
  8 Seek_Time_Performance   0x0025   100   100   015    Pre-fail  Offline      -       12196
  9 Power_On_Hours          0x0032   100   100   000    Old_age   Always       -       411
 10 Spin_Retry_Count        0x0033   100   100   051    Pre-fail  Always       -       0
 11 Calibration_Retry_Count 0x0012   100   100   000    Old_age   Always       -       0
 12 Power_Cycle_Count       0x0032   100   100   000    Old_age   Always       -       5
 13 Read_Soft_Error_Rate    0x000e   100   100   000    Old_age   Always       -       0
183 Unknown_Attribute       0x0032   100   100   000    Old_age   Always       -       0
184 Unknown_Attribute       0x0033   100   100   000    Pre-fail  Always       -       0
187 Reported_Uncorrect      0x0032   100   100   000    Old_age   Always       -       0
188 Unknown_Attribute       0x0032   100   100   000    Old_age   Always       -       0
190 Airflow_Temperature_Cel 0x0022   070   065   000    Old_age   Always       -       30 (Lifetime Min/Max 13/35)
194 Temperature_Celsius     0x0022   070   065   000    Old_age   Always       -       30 (Lifetime Min/Max 13/36)
195 Hardware_ECC_Recovered  0x001a   100   100   000    Old_age   Always       -       136625225
196 Reallocated_Event_Count 0x0032   100   100   000    Old_age   Always       -       0
197 Current_Pending_Sector  0x0012   100   100   000    Old_age   Always       -       0
198 Offline_Uncorrectable   0x0030   100   100   000    Old_age   Offline      -       0
199 UDMA_CRC_Error_Count    0x003e   100   100   000    Old_age   Always       -       0
200 Multi_Zone_Error_Rate   0x000a   100   100   000    Old_age   Always       -       0
201 Soft_Read_Error_Rate    0x000a   100   100   000    Old_age   Always       -       0

SMART Error Log Version: 1
No Errors Logged

SMART Self-test log structure revision number 1
Num  Test_Description    Status                  Remaining  LifeTime(hours)  LBA_of_first_error
# 1  Extended offline    Aborted by host               10%         4         -
# 2  Extended captive    Aborted by host               90%         1         -
# 3  Extended captive    Aborted by host               90%         0         -

SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

/dev/sdh1:
          Magic : a92b4efc
        Version : 1.1
    Feature Map : 0x0
     Array UUID : 7b3ab381:fd5dde20:9b116480:c5425916
           Name : media:5  (local to host media)
  Creation Time : Sat Dec 19 12:14:40 2009
     Raid Level : raid5
   Raid Devices : 4

 Avail Dev Size : 1953519738 (931.51 GiB 1000.20 GB)
     Array Size : 5860558848 (2794.53 GiB 3000.61 GB)
  Used Dev Size : 1953519616 (931.51 GiB 1000.20 GB)
    Data Offset : 264 sectors
   Super Offset : 0 sectors
          State : clean
    Device UUID : db2e5ae0:a98c1483:6b337782:d80712f7

    Update Time : Sat Jan  2 17:48:04 2010
       Checksum : 5a7f64f - correct
         Events : 488034

         Layout : left-symmetric
     Chunk Size : 256K

   Device Role : spare
   Array State : A.A. ('A' == active, '.' == missing)

===============================================================================

=== START OF INFORMATION SECTION ===
Device Model:     SAMSUNG HD103UJ
Serial Number:    S13PJ1MSB02759
Firmware Version: 1AA01118
User Capacity:    1,000,204,886,016 bytes
Device is:        In smartctl database [for details use: -P show]
ATA Version is:   8
ATA Standard is:  ATA-8-ACS revision 3b
Local Time is:    Sat Jan  2 18:44:20 2010 CET

==> WARNING: May need -F samsung or -F samsung2 enabled; see manual for details.

SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x00)	Offline data collection activity
					was never started.
					Auto Offline Data Collection: Disabled.
Self-test execution status:      (  16)	The self-test routine was aborted by
					the host.
Total time to complete Offline 
data collection: 		 (12379) seconds.
Offline data collection
capabilities: 			 (0x7f) SMART execute Offline immediate.
					Auto Offline data collection on/off support.
					Abort Offline collection upon new
					command.
					Offline surface scan supported.
					Self-test supported.
					Conveyance Self-test supported.
					Selective Self-test supported.
SMART capabilities:            (0x0003)	Saves SMART data before entering
					power-saving mode.
					Supports SMART auto save timer.
Error logging capability:        (0x01)	Error logging supported.
					General Purpose Logging supported.
Short self-test routine 
recommended polling time: 	 (   2) minutes.
Extended self-test routine
recommended polling time: 	 ( 207) minutes.
Conveyance self-test routine
recommended polling time: 	 (  22) minutes.
SCT capabilities: 	       (0x003f)	SCT Status supported.
					SCT Feature Control supported.
					SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x000f   100   100   051    Pre-fail  Always       -       24
  3 Spin_Up_Time            0x0007   071   071   011    Pre-fail  Always       -       9440
  4 Start_Stop_Count        0x0032   100   100   000    Old_age   Always       -       6
  5 Reallocated_Sector_Ct   0x0033   100   100   010    Pre-fail  Always       -       0
  7 Seek_Error_Rate         0x000f   253   253   051    Pre-fail  Always       -       0
  8 Seek_Time_Performance   0x0025   100   100   015    Pre-fail  Offline      -       11910
  9 Power_On_Hours          0x0032   100   100   000    Old_age   Always       -       411
 10 Spin_Retry_Count        0x0033   100   100   051    Pre-fail  Always       -       0
 11 Calibration_Retry_Count 0x0012   100   100   000    Old_age   Always       -       0
 12 Power_Cycle_Count       0x0032   100   100   000    Old_age   Always       -       3
 13 Read_Soft_Error_Rate    0x000e   100   100   000    Old_age   Always       -       24
183 Unknown_Attribute       0x0032   100   100   000    Old_age   Always       -       0
184 Unknown_Attribute       0x0033   100   100   000    Pre-fail  Always       -       0
187 Reported_Uncorrect      0x0032   100   100   000    Old_age   Always       -       24
188 Unknown_Attribute       0x0032   100   100   000    Old_age   Always       -       0
190 Airflow_Temperature_Cel 0x0022   071   065   000    Old_age   Always       -       29 (Lifetime Min/Max 11/35)
194 Temperature_Celsius     0x0022   071   064   000    Old_age   Always       -       29 (Lifetime Min/Max 11/36)
195 Hardware_ECC_Recovered  0x001a   100   100   000    Old_age   Always       -       333564510
196 Reallocated_Event_Count 0x0032   100   100   000    Old_age   Always       -       0
197 Current_Pending_Sector  0x0012   100   100   000    Old_age   Always       -       3
198 Offline_Uncorrectable   0x0030   100   100   000    Old_age   Offline      -       0
199 UDMA_CRC_Error_Count    0x003e   100   100   000    Old_age   Always       -       0
200 Multi_Zone_Error_Rate   0x000a   100   100   000    Old_age   Always       -       0
201 Soft_Read_Error_Rate    0x000a   099   099   000    Old_age   Always       -       25

SMART Error Log Version: 1
No Errors Logged

SMART Self-test log structure revision number 1
Num  Test_Description    Status                  Remaining  LifeTime(hours)  LBA_of_first_error
# 1  Extended offline    Aborted by host               00%         4         -
# 2  Extended captive    Aborted by host               90%         0         -

SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

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