On Tue, Jul 02, 2013 at 08:13:52PM -0700, Jack Pham wrote: > From: Manu Gautam <mgautam@xxxxxxxxxxxxxx> > > The USB Embedded High-speed Host Electrical Test (EHSET) defines the > SINGLE_STEP_SET_FEATURE test as follows: > > 1) The host enumerates the test device with VID:0x1A0A, PID:0x0108 > 2) The host sends the SETUP stage of a GetDescriptor(Device) > 3) The device ACKs the request > 4) The host issues SOFs for 15 seconds allowing the test operator to > raise the scope trigger just above the SOF voltage level > 5) The host sends the IN packet > 6) The device sends data in response, triggering the scope > 7) The host sends an ACK in response to the data > > This patch adds additional handling to the EHCI hub driver and allows > the EHSET driver to initiate this test mode by issuing a a SetFeature > request to the root hub with a Test Selector value of 0x06. From there > it mimics ehci_urb_enqueue() but separately submits QTDs for the > SETUP and DATA/STATUS stages in order to insert a delay in between. > > Signed-off-by: Manu Gautam <mgautam@xxxxxxxxxxxxxx> > Signed-off-by: Jack Pham <jackp@xxxxxxxxxxxxxx> Alan, any thoughts about this patch? thanks, greg k-h -- To unsubscribe from this list: send the line "unsubscribe linux-usb" in the body of a message to majordomo@xxxxxxxxxxxxxxx More majordomo info at http://vger.kernel.org/majordomo-info.html
