[PATCH 035/103] USB: keyspan_pda: remove bogus disconnect test in close

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Remove bogus (and unnecessary) test for serial->dev being NULL in close.

The device is never cleared, and close is never called after a completed
disconnect anyway.

Signed-off-by: Johan Hovold <jhovold@xxxxxxxxx>
---
 drivers/usb/serial/keyspan_pda.c | 9 ++-------
 1 file changed, 2 insertions(+), 7 deletions(-)

diff --git a/drivers/usb/serial/keyspan_pda.c b/drivers/usb/serial/keyspan_pda.c
index 0d992ba..da3b29e 100644
--- a/drivers/usb/serial/keyspan_pda.c
+++ b/drivers/usb/serial/keyspan_pda.c
@@ -649,13 +649,8 @@ error:
 }
 static void keyspan_pda_close(struct usb_serial_port *port)
 {
-	struct usb_serial *serial = port->serial;
-
-	if (serial->dev) {
-		/* shutdown our bulk reads and writes */
-		usb_kill_urb(port->write_urb);
-		usb_kill_urb(port->interrupt_in_urb);
-	}
+	usb_kill_urb(port->write_urb);
+	usb_kill_urb(port->interrupt_in_urb);
 }
 
 
-- 
1.8.1.1

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