[PATCH 029/103] USB: ark3116: remove bogus disconnect test in close

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Remove bogus (and unnecessary) test for serial->dev being NULL in close.

The device is never cleared, and close is never called after a completed
disconnect anyway.

Signed-off-by: Johan Hovold <jhovold@xxxxxxxxx>
---
 drivers/usb/serial/ark3116.c | 17 +++++++----------
 1 file changed, 7 insertions(+), 10 deletions(-)

diff --git a/drivers/usb/serial/ark3116.c b/drivers/usb/serial/ark3116.c
index dd78fa3..4188faf 100644
--- a/drivers/usb/serial/ark3116.c
+++ b/drivers/usb/serial/ark3116.c
@@ -345,18 +345,15 @@ static void ark3116_close(struct usb_serial_port *port)
 {
 	struct usb_serial *serial = port->serial;
 
-	if (serial->dev) {
-		/* disable DMA */
-		ark3116_write_reg(serial, UART_FCR, 0);
-
-		/* deactivate interrupts */
-		ark3116_write_reg(serial, UART_IER, 0);
+	/* disable DMA */
+	ark3116_write_reg(serial, UART_FCR, 0);
 
-		usb_serial_generic_close(port);
-		if (serial->num_interrupt_in)
-			usb_kill_urb(port->interrupt_in_urb);
-	}
+	/* deactivate interrupts */
+	ark3116_write_reg(serial, UART_IER, 0);
 
+	usb_serial_generic_close(port);
+	if (serial->num_interrupt_in)
+		usb_kill_urb(port->interrupt_in_urb);
 }
 
 static int ark3116_open(struct tty_struct *tty, struct usb_serial_port *port)
-- 
1.8.1.1

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