On Mon, Nov 22, 2010 at 08:41:59PM +0800, Sergei Shtylyov wrote:
> Hello.
>
> On 22-11-2010 7:02, Luo Andy wrote:
>
> > This patch adds test mode support for Langwell gadget driver.
>
> > Signed-off-by: Henry Yuan<hang.yuan@xxxxxxxxx>
> > Signed-off-by: Andy Luo<yifei.luo@xxxxxxxxx>
> [...]
>
> > diff --git a/include/linux/usb/langwell_udc.h b/include/linux/usb/langwell_udc.h
> > index 2d2d1bb..deeaabf 100644
> > --- a/include/linux/usb/langwell_udc.h
> > +++ b/include/linux/usb/langwell_udc.h
> > @@ -178,6 +178,11 @@ struct langwell_op_regs {
> > #define PORTS_WKDS BIT(21) /* wake on disconnect enable */
> > #define PORTS_WKCN BIT(20) /* wake on connect enable */
> > #define PORTS_PTC(p) (((p)>>16)&0xf) /* bits 19:16, port test control */
> > +#define TEST_J 1
> > +#define TEST_K 2
> > +#define TEST_SE0_NAK 3
> > +#define TEST_PACKET 4
> > +#define TEST_FORCE_EN 5
>
> There is nothing Langwell specific in these constants, so they should be
> in some generic USB header.
Actually I was thinking about adding the macros to "ch9.h", but I saw some
other implementation of test mode using their own headers. Anyway I will
move them to generic header "ch9.h".
Thanks,
Andy
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