Re: RIP on discard, JMicron USB adaptor

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On 2024-03-05 03:14:24, Martin K. Petersen wrote:

Well, the device reports that block provisioning is disabled (lbpme=0)
which explains why discard is not enabled by default.

Oddly enough your device does not report an UNMAP granularity. I'm
trying to figure out how your discard granularity ends up being 0 given
that your device reports a physical block size of 4096.


I have inserted 2 other m.2 SSDs into the adapter: There was no problem
with these, esp there was no warning about discard_granularity, or a RIP.
First SSD back in: RIP is back, too. I would guess the first SSD is bad.

Sorry for all the trouble. I should have tried another m.2 SSD first.

Just for the record, this is what smartctl -x reports about the bad SSD:

-------------------------------------------------------------------------------
root@dpcl082:~# smartctl -x /dev/sdf
smartctl 7.4 2023-08-01 r5530 [x86_64-linux-6.7.6-raw] (local build)
Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org

=== START OF INFORMATION SECTION ===
Model Number:                       SAMSUNG MZVLB1T0HALR-000L7
Serial Number:                      S3TPNX0K917992
Firmware Version:                   5L2QEXA7
PCI Vendor/Subsystem ID:            0x144d
IEEE OUI Identifier:                0x002538
Total NVM Capacity:                 1,024,209,543,168 [1.02 TB]
Unallocated NVM Capacity:           0
Controller ID:                      4
NVMe Version:                       1.2
Number of Namespaces:               1
Namespace 1 Size/Capacity:          1,024,209,543,168 [1.02 TB]
Namespace 1 Utilization:            1,015,982,354,432 [1.01 TB]
Namespace 1 Formatted LBA Size:     512
Namespace 1 IEEE EUI-64:            002538 8981be5959
Local Time is:                      Tue Mar  5 08:29:01 2024 CET
Firmware Updates (0x16):            3 Slots, no Reset required
Optional Admin Commands (0x0017):   Security Format Frmw_DL Self_Test
Optional NVM Commands (0x001f):     Comp Wr_Unc DS_Mngmt Wr_Zero Sav/Sel_Feat
Log Page Attributes (0x03):         S/H_per_NS Cmd_Eff_Lg
Maximum Data Transfer Size:         512 Pages
Warning  Comp. Temp. Threshold:     81 Celsius
Critical Comp. Temp. Threshold:     82 Celsius

Supported Power States
St Op     Max   Active     Idle   RL RT WL WT  Ent_Lat  Ex_Lat
 0 +     7.02W       -        -    0  0  0  0        0       0
 1 +     6.30W       -        -    1  1  1  1        0       0
 2 +     3.50W       -        -    2  2  2  2        0       0
 3 -   0.0760W       -        -    3  3  3  3      210    1200
 4 -   0.0050W       -        -    4  4  4  4     2000    8000

Supported LBA Sizes (NSID 0x1)
Id Fmt  Data  Metadt  Rel_Perf
 0 +     512       0         0

=== START OF SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

SMART/Health Information (NVMe Log 0x02)
Critical Warning:                   0x00
Temperature:                        24 Celsius
Available Spare:                    100%
Available Spare Threshold:          10%
Percentage Used:                    4%
Data Units Read:                    32,373,823 [16.5 TB]
Data Units Written:                 59,721,865 [30.5 TB]
Host Read Commands:                 848,557,454
Host Write Commands:                1,025,191,828
Controller Busy Time:               2,700
Power Cycles:                       2,222
Power On Hours:                     5,568
Unsafe Shutdowns:                   666
Media and Data Integrity Errors:    0
Error Information Log Entries:      3,607
Warning  Comp. Temperature Time:    0
Critical Comp. Temperature Time:    0
Temperature Sensor 1:               24 Celsius
Temperature Sensor 2:               25 Celsius

Error Information (NVMe Log 0x01, 16 of 64 entries)
No Errors Logged

Self-test Log (NVMe Log 0x06)
Self-test status: No self-test in progress
No Self-tests Logged
-------------------------------------------------------------------------------

Regards
Harri




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