hi, im searching for a way to be able to easily simulate faulty tape drives for CI/Testing purposes. The VTL emulation in TGT seems to have all the functionality required for my purpose and so i went on and implemented a proof of concept. The POC uses the VTL Tapes MAM header to store information about which errnous behavior should be simulated in case the tape is written. Different tapes can as such simulate different fault behaviors. See following description for more details: https://github.com/abbbi/tgt/blob/fault_injection/doc/README.ssc-fault-injection Is there any interest in getting such a feature into TGT's VTL emulation? Full diff here: https://github.com/fujita/tgt/compare/master...abbbi:fault_injection As the MAM header is probably not the best way for storing the information, would it be a good solution to store a special file alongside to the VTL file, including more meta information related to this feature? bye, - michael
