On 11/20/23 14:50, Mateusz Majewski wrote:
Currently, each trip point defined in the device tree corresponds to a single hardware interrupt. This commit instead switches to using two hardware interrupts, whose values are set dynamically using the set_trips callback. Additionally, the critical temperature threshold is handled specifically. Setting interrupts in this way also fixes a long-standing lockdep warning, which was caused by calling thermal_zone_get_trips with our lock being held. Do note that this requires TMU initialization to be split into two parts, as done by the parent commit: parts of the initialization call into the thermal_zone_device structure and so must be done after its registration, but the initialization is also responsible for setting up calibration, which must be done before thermal_zone_device registration, which will call set_trips for the first time; if the calibration is not done in time, the interrupt values will be silently wrong! Signed-off-by: Mateusz Majewski <m.majewski2@xxxxxxxxxxx> --- v4 -> v5: Simplified Exynos 7 code, used the correct register offsets for Exynos 7 and refactored some common register-setting code. v2 -> v3: Fixed formatting of some comments. v1 -> v2: We take clocks into account; anything that sets temperature thresholds needs clk. drivers/thermal/samsung/exynos_tmu.c | 393 ++++++++++++++------------- 1 file changed, 209 insertions(+), 184 deletions(-)
The code LGTM and I like the idea of dynamically configured IRQs for trips. Reviewed-by: Lukasz Luba <lukasz.luba@xxxxxxx> Regards, Lukasz
