PWMF_EXPORTED is misleadingly used as a bit numer in the pwm->flags, not
as a flag value, so the proper test for it must use test_bit() helper.
This fixes broken resume after putting per-channel data into driver data.
Fixes: e3fe982b2e4e ("pwm: samsung: Put per-channel data into driver data")
Signed-off-by: Marek Szyprowski <m.szyprowski@xxxxxxxxxxx>
---
drivers/pwm/pwm-samsung.c | 2 +-
1 file changed, 1 insertion(+), 1 deletion(-)
diff --git a/drivers/pwm/pwm-samsung.c b/drivers/pwm/pwm-samsung.c
index 568491ed6829..69d9f4577b34 100644
--- a/drivers/pwm/pwm-samsung.c
+++ b/drivers/pwm/pwm-samsung.c
@@ -631,7 +631,7 @@ static int pwm_samsung_resume(struct device *dev)
struct pwm_device *pwm = &chip->pwms[i];
struct samsung_pwm_channel *chan = &our_chip->channel[i];
- if (!(pwm->flags & PWMF_REQUESTED))
+ if (!test_bit(PWMF_REQUESTED, &pwm->flags))
continue;
if (our_chip->variant.output_mask & BIT(i))
--
2.34.1
