On Sat, 01 Dec 2018, Jonathan Cameron wrote: > On Wed, 28 Nov 2018 09:14:32 +0000 > Lee Jones <lee.jones@xxxxxxxxxx> wrote: > > > On Mon, 19 Nov 2018, Vignesh R wrote: > > > > > When performing single ended measurements with TSCADC, its recommended > > > to set negative input (SEL_INM_SWC_3_0) of ADC step to ADC's VREFN in the > > > corresponding STEP_CONFIGx register. > > > Also, the positive(SEL_RFP_SWC_2_0) and negative(SEL_RFM_SWC_1_0) > > > reference voltage for ADC step needs to be set to VREFP and VREFN > > > respectively in STEP_CONFIGx register. > > > Without these changes, there may be variation of as much as ~2% in the > > > ADC's digital output which is bad for precise measurement. > > > > > > Signed-off-by: Vignesh R <vigneshr@xxxxxx> > > > --- > > > drivers/iio/adc/ti_am335x_adc.c | 5 ++++- > > > > > include/linux/mfd/ti_am335x_tscadc.h | 4 ++++ > > > > Acked-by: Lee Jones <lee.jones@xxxxxxxxxx> > > > I'll leave this for v2 given changes in the first patch. > > My assumption is at the moment that both will go through mfd. > Shout Lee if you have other plans. I'm fine with that. -- Lee Jones [李琼斯] Linaro Services Technical Lead Linaro.org │ Open source software for ARM SoCs Follow Linaro: Facebook | Twitter | Blog
