Re: [PATCH 2/5] mtd: rawnand: mtk: Improve data sampling timing for read cycle

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On Mon, 2019-04-29 at 11:10 +0200, Miquel Raynal wrote:
> Hi Xiaolei,
> 
> Xiaolei Li <xiaolei.li@xxxxxxxxxxxx> wrote on Mon, 29 Apr 2019 14:38:31
> +0800:
> 
> > Currently, we expand RE# low level time by choosing the max value
> > between RE# pulse width and RE# access time, and sample data at the
> > rising edge of RE#.
> > 
> > Then, if RE# access time is bigger than RE# pulse width, the real
> > read cycle time may be more than NAND SPEC required. This makes
> > read performance be worse than that expected.
> > 
> > This patch improves data sampling timing by calculating RE# low level
> > time according to RE# pulse width. If RE# access time is bigger than
> > RE# pulse width, then delay sampling data timing.
> > 
> > The result of contrast test base on MT2712 evaluat board is as follow.
> > 
> > nand: Micron MT29F16G08ADBCAH4
> > nand: 2048 MiB, SLC, erase size: 256 KiB, page size: 4096, OOB size: 224
> > 
> > NFI 2x clock rate: 124800000 HZ.
> > 
> > Test tool: mtd_speedtest.ko
> > 
> > Read speed without this patch:
> > mtd_speedtest: page read speed is 14012 KiB/s
> > mtd_speedtest: 2 page read speed is 14860 KiB/s
> > 
> > Read speed with this patch:
> > mtd_speedtest: page read speed is 18724 KiB/s
> > mtd_speedtest: 2 page read speed is 18713 KiB/s
> > 
> > Signed-off-by: Xiaolei Li <xiaolei.li@xxxxxxxxxxxx>
> > ---
> >  drivers/mtd/nand/raw/mtk_nand.c | 22 +++++++++++++++++++++-
> >  1 file changed, 21 insertions(+), 1 deletion(-)
> > 
> > diff --git a/drivers/mtd/nand/raw/mtk_nand.c b/drivers/mtd/nand/raw/mtk_nand.c
> > index dd855f860a4b..a2f7af536380 100644
> > --- a/drivers/mtd/nand/raw/mtk_nand.c
> > +++ b/drivers/mtd/nand/raw/mtk_nand.c
> > @@ -87,6 +87,10 @@
> >  #define NFI_FDMM(x)		(0xA4 + (x) * sizeof(u32) * 2)
> >  #define NFI_FDM_MAX_SIZE	(8)
> >  #define NFI_FDM_MIN_SIZE	(1)
> > +#define NFI_DEBUG_CON1		(0x220)
> > +#define		STROBE_MASK		GENMASK(4, 3)
> > +#define		STROBE_SHIFT		(3)
> > +#define		MAX_STROBE_DLY		(3)
> >  #define NFI_MASTER_STA		(0x224)
> >  #define		MASTER_STA_MASK		(0x0FFF)
> >  #define NFI_EMPTY_THRESH	(0x23C)
> > @@ -509,6 +513,7 @@ static int mtk_nfc_setup_data_interface(struct nand_chip *chip, int csline,
> >  	struct mtk_nfc *nfc = nand_get_controller_data(chip);
> >  	const struct nand_sdr_timings *timings;
> >  	u32 rate, tpoecs, tprecs, tc2r, tw2r, twh, twst = 0, trlt = 0;
> > +	u32 tsel, reg;
> >  
> >  	timings = nand_get_sdr_timings(conf);
> >  	if (IS_ERR(timings))
> > @@ -556,10 +561,25 @@ static int mtk_nfc_setup_data_interface(struct nand_chip *chip, int csline,
> >  	if ((twh + 1) * 1000000 / rate < timings->tRC_min / 1000)
> >  		trlt = (timings->tRC_min / 1000 - (twh + 1) * 1000000 / rate)
> >  			* 1000;
> > -	trlt = max3(trlt, timings->tREA_max, timings->tRP_min) / 1000;
> > +	trlt = max(trlt, timings->tRP_min) / 1000;
> >  	trlt = DIV_ROUND_UP(trlt * rate, 1000000) - 1;
> >  	trlt &= 0xf;
> >  
> > +	/* Calculate strobe sel */
> > +	reg = nfi_readl(nfc, NFI_DEBUG_CON1);
> > +	reg &= ~STROBE_MASK;
> > +	if ((trlt + 1) * 1000000 / rate < timings->tREA_max / 1000) {
> 
> Please do the calculation and condition in separate step, this is
> hardly readable. Maybe you can explain it with a comment as well.
Sorry to trouble you.
I will change it as your advice in next patch version.

> 
> > +		tsel = timings->tREA_max / 1000;
> > +		tsel = DIV_ROUND_UP(tsel * rate, 1000000);
> 
> Are you sure tsel * rate cannot overflow?
Thanks for your reminding.
The unit of tsel here is nano second, and the unit of rate is KHZ.
There should be no overflowing here.

> 
> > +		tsel -= (trlt + 1);
> > +		if (tsel > MAX_STROBE_DLY) {
> > +			trlt += tsel - MAX_STROBE_DLY;
> > +			tsel = MAX_STROBE_DLY;
> > +		}
> > +		reg |= tsel << STROBE_SHIFT;
> > +	}
> > +	nfi_writel(nfc, reg, NFI_DEBUG_CON1);
> > +
> >  	/*
> >  	 * ACCON: access timing control register
> >  	 * -------------------------------------
> 
> 
> 
> 
> Thanks,
> Miquèl



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