On Tue, Jan 24, 2023 at 12:27:55PM +0100, Hans de Goede wrote: > On 1/23/23 19:46, Andy Shevchenko wrote: > > On Mon, Jan 23, 2023 at 01:51:41PM +0100, Hans de Goede wrote: > >> Add a test pattern control. This is a 1:1 copy of the test pattern > >> control in the main drivers/media/i2c/ov2680.c driver. > > > > Hmm... I'm not sure I understand the trend of the changes. > > We have two drivers of the same sensor, correct? > > So, the idea is to move the AtomISP-specific one to be like > > the generic and then kill it eventually? > > The goal is to kill one eventually yes. I'm not sure which > one to kill yet though. I have actually found a whole bunch > of bugs in the main drivers/media/i2c/ov2680.c code and > given its buggy-ness I wonder if anyone is actually using it. > > I need to start an email thread about this (and a couple of > other open questions which I have), I have a bunch of notes > which I need to turn into emails for this. > > > If so, why do we add something here? > > Because I suspect that the atomisp version might eventually > be the one we want to keep (and move to drivers/media/i2c). Fine, just add a few words into cover letter. Btw, do you use `b4` tool to handle patch(es) series? It has a nice feature to handle a series as a PR. In that case the cover letter becomes a merge-commit message which is cool feature in my opinion. -- With Best Regards, Andy Shevchenko
