Re: [PATCH v2 8/8] iio: adc: ad9467: add digital interface test to debugfs

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On Sat, 2024-08-03 at 14:38 +0100, Jonathan Cameron wrote:
> On Fri, 02 Aug 2024 16:27:06 +0200
> Nuno Sa via B4 Relay <devnull+nuno.sa.analog.com@xxxxxxxxxx> wrote:
> 
> > From: Nuno Sa <nuno.sa@xxxxxxxxxx>
> > 
> > One useful thing to do (in case of problems) in this high speed devices
> > with digital interfaces is to try different test patterns to see if the
> > interface is working properly (and properly calibrated). Hence add this
> > to debugfs.
> > 
> > On top of this, for some test patterns, the backend may have a matching
> > validator block which can be helpful in identifying possible issues. For
> > the other patterns some test equipment must be used so one can look into
> > the signal and see how it looks like.
> > 
> > Hence, we also add the backend debugfs interface with
> > iio_backend_debugfs_add().
> > 
> > Signed-off-by: Nuno Sa <nuno.sa@xxxxxxxxxx>
> I'll apply the series, but I would like a docs update for the
> debugfs files this patch adds.  That can be a follow up patch.
> 
> Jonathan

will do

- Nuno Sá





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