Justin Piszcz wrote:
Run smart tests yet?
1. smartctl -d ata -t short /dev/sda
2. smartctl -d ata -a /dev/sda (after few min)
also replace short with long
and then paste the output:
smartctl -d ata -a /dev/sda
<smartctl>
smartctl -a -d ata /dev/sdc
smartctl version 5.37 [i686-pc-linux-gnu] Copyright (C) 2002-6 Bruce Allen
Home page is http://smartmontools.sourceforge.net/
=== START OF INFORMATION SECTION ===
Device Model: SAMSUNG HD501LJ
Serial Number: S0MUJ1GP506675
Firmware Version: CR100-10
User Capacity: 500,107,862,016 bytes
Device is: In smartctl database [for details use: -P show]
ATA Version is: 8
ATA Standard is: Not recognized. Minor revision code: 0x52
Local Time is: Sat Jun 30 23:11:34 2007 CEST
==> WARNING: May need -F samsung or -F samsung2 enabled; see manual for
details.
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection:
Disabled.
Self-test execution status: ( 0) The previous self-test routine
completed
without error or no self-test
has ever
been run.
Total time to complete Offline
data collection: (8633) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection
on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 147) minutes.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE
UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 100 100 051 Pre-fail
Always - 1
3 Spin_Up_Time 0x0007 100 100 015 Pre-fail
Always - 7808
4 Start_Stop_Count 0x0032 100 100 000 Old_age
Always - 9
5 Reallocated_Sector_Ct 0x0033 253 253 010 Pre-fail
Always - 0
7 Seek_Error_Rate 0x000f 253 253 051 Pre-fail
Always - 0
8 Seek_Time_Performance 0x0025 253 253 015 Pre-fail
Offline - 0
9 Power_On_Hours 0x0032 253 253 000 Old_age
Always - 8
10 Spin_Retry_Count 0x0033 253 253 051 Pre-fail
Always - 0
11 Calibration_Retry_Count 0x0012 253 253 000 Old_age
Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age
Always - 6
187 Unknown_Attribute 0x0032 253 253 000 Old_age Always
- 0
188 Unknown_Attribute 0x0032 253 253 000 Old_age Always
- 0
190 Temperature_Celsius 0x0022 060 055 000 Old_age Always
- 40
194 Temperature_Celsius 0x0022 118 103 000 Old_age Always
- 40
195 Hardware_ECC_Recovered 0x001a 100 100 000 Old_age Always
- 615567200
196 Reallocated_Event_Count 0x0032 253 253 000 Old_age Always
- 0
197 Current_Pending_Sector 0x0012 253 253 000 Old_age Always
- 0
198 Offline_Uncorrectable 0x0030 253 253 000 Old_age
Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always
- 0
200 Multi_Zone_Error_Rate 0x000a 253 100 000 Old_age Always
- 0
201 Soft_Read_Error_Rate 0x000a 100 100 000 Old_age Always
- 0
202 TA_Increase_Count 0x0032 253 253 000 Old_age Always
- 0
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining
LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed without error 00% 6
-
# 2 Short offline Completed without error 00% 4
-
SMART Selective Self-Test Log Data Structure Revision Number (0) should be 1
SMART Selective self-test log data structure revision number 0
Warning: ATA Specification requires selective self-test log data
structure revision number = 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
</smartctl>
-
To unsubscribe from this list: send the line "unsubscribe linux-ide" in
the body of a message to majordomo@xxxxxxxxxxxxxxx
More majordomo info at http://vger.kernel.org/majordomo-info.html
