Tejun Heo wrote:
Lars Michael Jogbäck wrote:
I have a system with a Sil3124 controller and two Sil3726 port multipliers.
I'm running 2.6.18.1 with the patches from
http://home-tj.org/wiki/index.php/Libata-tj-stable
since I was not able to get the port multipler to work at all with
2.6.21 (perhaps the support for PMP is not fully integrated there).
One of my Sil3726 is freezing my system approx one time per hour when
the disks are under load.
ata5.00: exception Emask 0x0 SAct 0x0 SErr 0x0 action 0x2 frozen
ata5.00: tag 0 cmd 0xea Emask 0x4 stat 0x40 err 0x0 (timeout)
Hmmm... that's FLUSH_CACHE timing out.
Is there a way that I can generate a FLUSH_CACHE event manually somehow?
I suspect that the root-cause of the problem could be drive-related. All
the disks on the other Sil3726 are WD4000KD's and the
disks attached to this one is 3xWD4000KD and 1xWD4000KS and 1xSamsung
HD501LJ. Is there a way of test this?
I think the disk attached to port 0 might be bad. Please report the
result of 'smartctl -d ata -a /dev/sdX' where sdX is the device attached
to the failing port.
smartctl version 5.36 [i686-pc-linux-gnu] Copyright (C) 2002-6 Bruce Allen
Home page is http://smartmontools.sourceforge.net/
=== START OF INFORMATION SECTION ===
Device Model: SAMSUNG HD501LJ
Serial Number: S0VVJ1NP300009
Firmware Version: CR100-10
User Capacity: 500,107,862,016 bytes
Device is: In smartctl database [for details use: -P show]
ATA Version is: 8
ATA Standard is: Not recognized. Minor revision code: 0x52
Local Time is: Wed May 2 15:26:35 2007 CEST
==> WARNING: May need -F samsung or -F samsung2 enabled; see manual for
details.
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection:
Disabled.
Self-test execution status: ( 0) The previous self-test routine
completed
without error or no self-test
has ever
been run.
Total time to complete Offline
data collection: (8887) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection
on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 152) minutes.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE
UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 100 100 051 Pre-fail
Always - 2
3 Spin_Up_Time 0x0007 100 100 015 Pre-fail
Always - 7232
4 Start_Stop_Count 0x0032 100 100 000 Old_age
Always - 3
5 Reallocated_Sector_Ct 0x0033 253 253 010 Pre-fail
Always - 0
7 Seek_Error_Rate 0x000f 253 253 051 Pre-fail
Always - 0
8 Seek_Time_Performance 0x0025 253 253 015 Pre-fail
Offline - 0
9 Power_On_Hours 0x0032 253 253 000 Old_age
Always - 49
10 Spin_Retry_Count 0x0033 253 253 051 Pre-fail
Always - 0
11 Calibration_Retry_Count 0x0012 253 253 000 Old_age
Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age
Always - 3
187 Unknown_Attribute 0x0032 253 253 000 Old_age
Always - 0
188 Unknown_Attribute 0x0032 253 253 000 Old_age
Always - 0
190 Unknown_Attribute 0x0022 070 069 000 Old_age
Always - 30
194 Temperature_Celsius 0x0022 148 145 000 Old_age
Always - 30
195 Hardware_ECC_Recovered 0x001a 100 100 000 Old_age
Always - 385707184
196 Reallocated_Event_Count 0x0032 253 253 000 Old_age
Always - 0
197 Current_Pending_Sector 0x0012 253 253 000 Old_age
Always - 0
198 Offline_Uncorrectable 0x0030 253 253 000 Old_age
Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age
Always - 0
200 Multi_Zone_Error_Rate 0x000a 100 100 000 Old_age
Always - 0
201 Soft_Read_Error_Rate 0x000a 100 100 000 Old_age
Always - 0
202 TA_Increase_Count 0x0032 100 100 000 Old_age
Always - 21
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining
LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00%
49 -
SMART Selective Self-Test Log Data Structure Revision Number (0) should be 1
SMART Selective self-test log data structure revision number 0
Warning: ATA Specification requires selective self-test log data
structure revision number = 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
Is there an updated patch-set for port multipliers in a later kernel
than 2.6.18.1?
Sorry but not yet.
Regards,
/LM
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