On Thu, Jun 13, 2024 at 09:10:37PM +0000, Gulam Mohamed wrote: > I looked at the LTP test case failure and also the function tst_detach_device_by_fd() which failed. Our kernel patch will defer all the attempts to detach a loop device to the last close, to fix an issue. > The tst_detach_device_by_fd() in LTP test case will open the loop device and repeatedly checks for error code ENXIO. As the new approach, as I mentioned above, will defer the detach to last close and the last close happens *only* when the LTP test function tst_detach_device_by_fd() returns, the test will obviously fail. So, Can you please modify the LTP test case to accommodate the new behaviour of kernel code for loop detach? > Please let us know your comments. I still think simply setting the rundown state is the better approach..
