On 05/03/2024 03.50, Nicholas Piggin wrote:
On Mon Mar 4, 2024 at 4:22 PM AEST, Thomas Huth wrote:
On 26/02/2024 10.38, Nicholas Piggin wrote:
This test stores to a bunch of pages and verifies previous stores,
while being continually migrated. This can fail due to a QEMU TCG
physical memory dirty bitmap bug.
Good idea, but could we then please drop "continuous" test from
selftest-migration.c again? ... having two common tests to exercise the
continuous migration that take quite a bunch of seconds to finish sounds
like a waste of time in the long run to me.
Yeah if you like. I could shorten them up a bit. I did want to have
the selftests for just purely testing the harness with as little
"test" code as possible.
Ok, but then please shorten the selftest to ~ 2 seconds if possible, please.
Thomas
