[PATCH 3/3] intel: Add regression tests for batch decode.

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On Wed, 4 Jan 2012 00:24:28 +0100, Daniel Vetter <daniel at ffwll.ch> wrote:
> On Tue, Jan 03, 2012 at 03:05:26PM -0800, Eric Anholt wrote:
> > The .batch was generated using the dump-a-batch branch of
> > 
> > git://people.freedesktop.org/~anholt/mesa
> > 
> > using glxgears on gen7 hardware, using INTEL_DEVID_OVERRIDE for
> > non-gen7 (this means that offsets in the buffers for non-gen7 are 0!).
> > The .ref was generated by:
> > 
> > ./test_decode tests/gen7-3d.batch -dump.
> > 
> > The .sh exists because you can't supply arguments to tests using the
> > simple automake tests driver.  Something reasonable could be done
> > using automake's parallel-tests driver (in fact, a previous version of
> > the patch did that), but I was concerned that:
> > 
> > 1) The parallel-tests driver is documented to be unstable -- they may
> >    change interfaces on us later.
> > 2) The parallel-tests driver hides the output of tests in .log files
> >    scattered all over the tree, which was ugly and more painful to
> >    work with.
> > ---
> >  intel/Makefile.am                 |   17 +
> >  intel/tests/gen7-3d.batch         |  Bin 0 -> 4504 bytes
> >  intel/tests/gen7-3d.batch-ref.txt | 1350 +++++++++++++++++++++++++++++++++++++
> 
> I'm missing the *.batch* stuff for gen4-gen6 mentioned in the Makefile.am.
> From looking throught the code I've also expected the *.batch to be a
> symlink to test-batch.sh.

Failure to git add.  Fixed locally.
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