On Thu, Aug 31, 2017 at 02:33:23PM -0700, Vinay Belgaumkar wrote: > Added the missing IGT_TEST_DESCRIPTION and some subtest > descriptions. Trying to establish a method to document Hey Vinay, Please add appropriate tag to the subject, as this is clearly an RFC. > subtests, it should describe the feature being tested > rather than how. The HOW part can, if needed, be > described in the test code. > > Documenting subtests will give us a good way to trace > feature test coverage, and also help a faster ramp > for understanding the test code. > > v2: Removed duplication, addressed comments, cc'd test author > > Cc: Michał Winiarski <michal.winiarski@xxxxxxxxx> > Cc: Eric Anholt <eric@xxxxxxxxxx> > > Signed-off-by: Vinay Belgaumkar <vinay.belgaumkar@xxxxxxxxx> > --- > tests/gem_flink_basic.c | 36 ++++++++++++++++++++++++++---------- > 1 file changed, 26 insertions(+), 10 deletions(-) > > diff --git a/tests/gem_flink_basic.c b/tests/gem_flink_basic.c > index 26ae7d6..9c8c4c3 100644 > --- a/tests/gem_flink_basic.c > +++ b/tests/gem_flink_basic.c > @@ -36,6 +36,8 @@ > #include <sys/ioctl.h> > #include "drm.h" > > +IGT_TEST_DESCRIPTION("Tests for flink - a way to export a gem object by name"); > + > static void > test_flink(int fd) > { > @@ -44,8 +46,6 @@ test_flink(int fd) > struct drm_gem_open open_struct; > int ret; > > - igt_info("Testing flink and open.\n"); > - > memset(&create, 0, sizeof(create)); > create.size = 16 * 1024; > ret = ioctl(fd, DRM_IOCTL_I915_GEM_CREATE, &create); > @@ -69,8 +69,6 @@ test_double_flink(int fd) > struct drm_gem_flink flink2; > int ret; > > - igt_info("Testing repeated flink.\n"); > - > memset(&create, 0, sizeof(create)); > create.size = 16 * 1024; > ret = ioctl(fd, DRM_IOCTL_I915_GEM_CREATE, &create); > @@ -92,8 +90,6 @@ test_bad_flink(int fd) > struct drm_gem_flink flink; > int ret; > > - igt_info("Testing error return on bad flink ioctl.\n"); > - > flink.handle = 0x10101010; > ret = ioctl(fd, DRM_IOCTL_GEM_FLINK, &flink); > igt_assert(ret == -1 && errno == ENOENT); > @@ -105,8 +101,6 @@ test_bad_open(int fd) > struct drm_gem_open open_struct; > int ret; > > - igt_info("Testing error return on bad open ioctl.\n"); > - > open_struct.name = 0x10101010; > ret = ioctl(fd, DRM_IOCTL_GEM_OPEN, &open_struct); > > @@ -121,8 +115,6 @@ test_flink_lifetime(int fd) > struct drm_gem_open open_struct; > int ret, fd2; > > - igt_info("Testing flink lifetime.\n"); > - > fd2 = drm_open_driver(DRIVER_INTEL); > > memset(&create, 0, sizeof(create)); > @@ -134,11 +126,13 @@ test_flink_lifetime(int fd) > ret = ioctl(fd2, DRM_IOCTL_GEM_FLINK, &flink); > igt_assert_eq(ret, 0); > > + /* Open another reference to the gem object */ > open_struct.name = flink.name; > ret = ioctl(fd, DRM_IOCTL_GEM_OPEN, &open_struct); > igt_assert_eq(ret, 0); > igt_assert(open_struct.handle != 0); > > + /* Before closing the previous one */ > close(fd2); > fd2 = drm_open_driver(DRIVER_INTEL); > > @@ -155,14 +149,36 @@ igt_main > igt_fixture > fd = drm_open_driver(DRIVER_INTEL); > > + /** > + * basic: Much better than the previous proposal. But I do not like having the subtest name twice - in the comment and in the igt_subtest(). IMO it's better to have a parser that can extract the name from the following igt_subtest() than having a place where when we have duplication and we can go out of sync. I've been following your efforts and I have some question and thoughts to share. ### Questions 1. What's the actual problem statement? What are you trying to solve here? 2. Who, in your mind, is the supposed reader of the documentation? How's that different form someone who is supposed to look at the code directly? 3. Why are you trying to drive this? What's your motivation? ### My Two (Euro)cents As Michal stressed, in a reply to the previous revision, we should not be doing C to English translation. My reasoning: 1. Maintenance hell - if you describe inner workings of tests in too much detail, you will have two places that you have to update when you are making even the slightest adjustments. And people will forget to update the comments, and will receive negative reviews, and will have to respin the series making the changes again, this time in the "English" implementation. To me it's unnecessary rising of the bar for the contributors. 2. Code is enough - I think it's safe to assume that anyone who is enough technically inclined to understand the English translation of the code will be able to understand the code itself. And the code is openly and freely available. So I do not see much use of embedding it into the documentation. 3. The more manual tasks we have for the tests developers, the less appealing the project is. If it will get unpleasant, the people will think twice about contributing - and not to contribute better things, but whether the chores are worth their time. ### My Expectations Definitely we should improve IGT documentation and general readability. But having too much documentation is even wore. 1. Subtest documentation should be as brief as possible and give you good intuition on what it is exercising - for actual details people should refer the source code. 2. It should not describe the "feature" it is testing, there are other places to do that. It should just give enough of a context to be understood by someone who has the general idea of the "feature". 3. It should feel like an added value to the developers, not as a unnecessary, manual chore. 4. It should feel natural - it should just take a single glance at the surrounding code and developer should know what to do - how the commenting is done, what style should be assumed. Many people do not read guidelines, and the longer the file is, the less likely is that someone will read it through. The guidelines should be simple, to the point, statements, that are supposed by actual good examples. It's also easier to get a good idea what to do when you are are pointed to good code in the actual code base instead of some artificial example. 5. Comments inside the tests should be "the last resort", if the code could not be rewritten easily in more readable manner. Their main purpose is to help people reading code understand non-obvious parts. This should be enforced by reviewers - if it takes you too long to understand something, comment on that, possibly with suggested rewrite/proposition of a comment. Looking forward to your reply! -- Cheers, Arek _______________________________________________ Intel-gfx mailing list Intel-gfx@xxxxxxxxxxxxxxxxxxxxx https://lists.freedesktop.org/mailman/listinfo/intel-gfx