Re: [I-G-T 3/3] igt/gem_mocs_settings: Reduce the amount of cascading failures

[Date Prev][Date Next][Thread Prev][Thread Next][Date Index][Thread Index]

 



On Mon, Aug 01, 2016 at 10:33:17AM +0100, Peter Antoine wrote:
> On Mon, 1 Aug 2016, Chris Wilson wrote:
> 
> > On Fri, Jul 29, 2016 at 10:34:36AM +0100, Peter Antoine wrote:
> > > If one of the previous tests fails then the following tests fail.
> > > This patch means that the following tests do not fail when the previous
> > > test fails (for some cases).
> > 
> > The problem is just gem_mocs_settings hasn't split its tests up into
> > subtests.
> Chris,
> 
> Can you expand? The tests are at the minimal size for sensible results (I
> think). The problem is opening the driver for master when the test fails
> then the following tests will fail as master is not closed.
> 
> Is there a mechanism in the igt framework for doing this close on
> failure/skip?
> 
> If I move the master open code in the fixtures will this get called on all
> exit cases?

For a real test runner you need to run each individual subtest separate
(to avoid contamination). Then process exit will take care of any cleanup
needed with file descriptors. For anything else there's exit handlers, but
they're not 100% reliable

Adding hacks to make subtest runs differently isn't really how igt tests
are meant to be. Hence I concure on Chris' objection here.
-Daniel
-- 
Daniel Vetter
Software Engineer, Intel Corporation
http://blog.ffwll.ch
_______________________________________________
Intel-gfx mailing list
Intel-gfx@xxxxxxxxxxxxxxxxxxxxx
https://lists.freedesktop.org/mailman/listinfo/intel-gfx




[Index of Archives]     [Linux USB Devel]     [Linux Audio Users]     [Yosemite News]     [Linux Kernel]     [Linux SCSI]
  Powered by Linux