On 7/8/22 16:00, Fabio Estevam wrote:
From: Fabio Estevam <festevam@xxxxxxx> The sn65dsi83 chip has a test pattern generator capability. Add a sysfs entry to allow enabling and disabling it in runtime. This is helpful during the MIPI DSI/LVDS bringup. To enable the test pattern generator: echo 1 > /sys/bus/i2c/devices/0-002c/pattern_generator To disable the test pattern generator: echo 0 > /sys/bus/i2c/devices/0-002c/pattern_generator
I have more of a design question here: - Shouldn't we implement some sort of standardized helper to set test pattern on various other bridges ? There are other bridges which do support test pattern generation too. - The API should be able to select different test patterns, since some bridges support more than one. Thoughts ?
