When looking up a power supply through its OF node, probe it if it
hasn't already.
The goal is to reduce deferred probes to a minimum, as it makes it very
cumbersome to find out why a device failed to probe, and can introduce
very big delays in when a critical device is probed.
Signed-off-by: Tomeu Vizoso <tomeu.vizoso@xxxxxxxxxxxxx>
---
Changes in v4: None
Changes in v3: None
Changes in v2: None
drivers/power/power_supply_core.c | 3 +++
1 file changed, 3 insertions(+)
diff --git a/drivers/power/power_supply_core.c b/drivers/power/power_supply_core.c
index 456987c88baa..80bc89f4ae89 100644
--- a/drivers/power/power_supply_core.c
+++ b/drivers/power/power_supply_core.c
@@ -19,6 +19,7 @@
#include <linux/err.h>
#include <linux/power_supply.h>
#include <linux/thermal.h>
+#include <linux/of_device.h>
#include "power_supply.h"
/* exported for the APM Power driver, APM emulation */
@@ -206,6 +207,8 @@ static int power_supply_find_supply_from_node(struct device_node *supply_node)
{
int error;
+ of_device_probe(supply_node);
+
/*
* class_for_each_device() either returns its own errors or values
* returned by __power_supply_find_supply_from_node().
--
2.4.3
--
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