Hi, kernel test robot noticed the following build warnings: [auto build test WARNING on b1a1eaf6183697b77f7243780a25f35c7c0c8bdf] url: https://github.com/intel-lab-lkp/linux/commits/marius-cristea-microchip-com/dt-bindings-iio-adc-adding-support-for-PAC193X/20240223-004332 base: b1a1eaf6183697b77f7243780a25f35c7c0c8bdf patch link: https://lore.kernel.org/r/20240222164206.65700-2-marius.cristea%40microchip.com patch subject: [PATCH v5 1/2] dt-bindings: iio: adc: adding support for PAC193X compiler: loongarch64-linux-gcc (GCC) 13.2.0 reproduce: (https://download.01.org/0day-ci/archive/20240224/202402241545.xf7CnlPz-lkp@xxxxxxxxx/reproduce) If you fix the issue in a separate patch/commit (i.e. not just a new version of the same patch/commit), kindly add following tags | Reported-by: kernel test robot <lkp@xxxxxxxxx> | Closes: https://lore.kernel.org/oe-kbuild-all/202402241545.xf7CnlPz-lkp@xxxxxxxxx/ dtcheck warnings: (new ones prefixed by >>) >> Documentation/devicetree/bindings/iio/adc/microchip,pac1934.yaml:51:9: [warning] wrong indentation: expected 6 but found 8 (indentation) vim +51 Documentation/devicetree/bindings/iio/adc/microchip,pac1934.yaml 8 9 maintainers: 10 - Marius Cristea <marius.cristea@xxxxxxxxxxxxx> 11 12 description: | 13 This device is part of the Microchip family of Power Monitors with 14 Accumulator. 15 The datasheet for PAC1931, PAC1932, PAC1933 and PAC1934 can be found here: 16 https://ww1.microchip.com/downloads/aemDocuments/documents/OTH/ProductDocuments/DataSheets/PAC1931-Family-Data-Sheet-DS20005850E.pdf 17 18 properties: 19 compatible: 20 enum: 21 - microchip,pac1931 22 - microchip,pac1932 23 - microchip,pac1933 24 - microchip,pac1934 25 26 reg: 27 maxItems: 1 28 29 "#address-cells": 30 const: 1 31 32 "#size-cells": 33 const: 0 34 35 interrupts: 36 maxItems: 1 37 38 slow-io-gpios: 39 description: 40 A GPIO used to trigger a change is sampling rate (lowering the chip power 41 consumption). If configured in SLOW mode, if this pin is forced high, 42 sampling rate is forced to eight samples/second. When it is forced low, 43 the sampling rate is 1024 samples/second unless a different sample rate 44 has been programmed. 45 46 patternProperties: 47 "^channel@[1-4]+$": 48 type: object 49 $ref: adc.yaml 50 description: > 51 Represents the external channels which are connected to the ADC. 52 53 properties: 54 reg: 55 items: 56 minimum: 1 57 maximum: 4 58 59 shunt-resistor-micro-ohms: 60 description: 61 Value in micro Ohms of the shunt resistor connected between 62 the SENSE+ and SENSE- inputs, across which the current is measured. 63 Value is needed to compute the scaling of the measured current. 64 65 required: 66 - reg 67 - shunt-resistor-micro-ohms 68 69 unevaluatedProperties: false 70 71 required: 72 - compatible 73 - reg 74 - "#address-cells" 75 - "#size-cells" 76 -- 0-DAY CI Kernel Test Service https://github.com/intel/lkp-tests/wiki
