On Wed, Oct 18, 2023 at 4:38 PM Erhard Furtner <erhard_f@xxxxxxxxxxx> wrote: > > Greetings! > > Getting this at every boot on my G5 with kernel v6.6-rc6 with OF_UNITTEST and OF_OVERLAY selected: > > [...] > ### dt-test ### EXPECT \ : OF: ERROR: of_node_release() detected bad > of_node_put() on /testcase-data/refcount-node ### dt-test ### pass > of_unittest_lifecycle():3189 OF: ERROR: of_node_release() detected bad > of_node_put() on /testcase-data/refcount-node ### dt-test ### EXPECT / : OF: > ERROR: of_node_release() detected bad of_node_put() on > /testcase-data/refcount-node ### dt-test ### EXPECT \ : ------------[ cut here > ]------------ ### dt-test ### EXPECT \ : WARNING: <<all>> ### dt-test ### > EXPECT \ : refcount_t: underflow; use-after-free. ### dt-test ### EXPECT \ : The test tells you to expect a use-after-free... > ---[ end trace <<int>> ]--- ### dt-test ### pass of_unittest_lifecycle():3209 > ------------[ cut here ]------------ > refcount_t: underflow; use-after-free. Then you get a use-after-free. Looks like it is working as designed. I believe it's the same with kmemleak. Note that running DT unittests also taints the kernel. That's because they are not meant to be run on a production system. Rob
