Re: Device Tree runtime unit tests: Harmonisation

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On 2/2/22 5:31 AM, Naresh Kamboju wrote:
> Linaro started doing Linux kernel Functional Validation (LKFT).
> As part of LKFT recently we have enabled CONFIG_OF_UNITTEST=y in our
> daily test CI.
> 
> The output of the test looks as below. The current problem is that we
> have a hard time to see (grep) pass/fail for each individual test. We
> only see a summary at the end with x pass and y fails.

The FAIL messages are printed at loglevel KERN_ERR.  The pass messages
are printed at loglevel KERN_DEBUG.  To see the pass messages, set the
loglevel to allow debug output.

Unfortunately this can add lots of debug output, unless you use dynamic
debug to only enable debug for drivers/of/unittest.o.  There are only
a few other pr_debug() messages in unittest.

I think a better solution would be to add a config option, something
like CONFIG_OF_UNITTEST_VERBOSE, that would print the pass messages
at loglevel KERN_ERR.  I'll submit a patch for that and see what the
review responses are.

> We would like to get your opinion of how hard it would be to include
> that in the output per test. Maybe like TAP version 14?
> Another question would be how hard do you think it would be to rewrite
> this to a kunit test, if even applicable? I have provided the kunit
> output links at the end of this email.

Devicetree unittests were suggested as a good candidate as a first
test to convert to kunit when kunit was implemented.  Brendan tried
to convert it, and we quickly saw that it was not a good candidate.
Devicetree unittests do not fit the unit test mold; they are a very
different creature.  Brendan has a good term for this type of test
(Brendan, was it "acceptance" test?).

> 
> 
> Test output:
> ------------
> [    0.000000] Booting Linux on physical CPU 0x0000000100 [0x410fd033]
> [    0.000000] Linux version 5.17.0-rc1-next-20220127
> (tuxmake@tuxmake) (aarch64-linux-gnu-gcc (Debian 11.2.0-9) 11.2.0, GNU
> ld (GNU Binutils for Debian) 2.37) #1 SMP PREEMPT @1643255563
> [    0.000000] Machine model: ARM Juno development board (r2)
> 
> <trimmed output>
> 
> [    3.285226] ### dt-test ### start of unittest - you will see error messages
> [    3.293269] ### dt-test ### EXPECT \ : Duplicate name in
> testcase-data, renamed to \"duplicate-name#1\"
> [    3.293456] Duplicate name in testcase-data, renamed to \"duplicate-name#1\"
> [    3.313367] ### dt-test ### EXPECT / : Duplicate name in
> testcase-data, renamed to \"duplicate-name#1\"
> [    3.314709] ### dt-test ### EXPECT \ : OF:
> /testcase-data/phandle-tests/consumer-a: could not get
> #phandle-cells-missing for /testcase-data/phandle-tests/provider1
> [    3.323968] OF: /testcase-data/phandle-tests/consumer-a: could not
> get #phandle-cells-missing for /testcase-data/phandle-tests/provider1
> 
> <trimmed output>
> 
> [    5.118400] ### dt-test ### EXPECT / : OF: overlay: ERROR: multiple
> fragments add and/or delete node
> /testcase-data-2/substation@100/motor-1/electric
> [    5.121358] atkbd serio1: keyboard reset failed on 1c070000.kmi
> [    5.134160] ### dt-test ### end of unittest - 257 passed, 0 failed
> 
> 
> Ref:
> Full test output of of-unittest
> https://lkft.validation.linaro.org/scheduler/job/4458582#L1019
> https://lkft.validation.linaro.org/scheduler/job/4404330#L428
> 
> Kunit example test output that we are running in our daily CI loop.
> https://qa-reports.linaro.org/lkft/linux-stable-rc-linux-5.10.y/build/v5.10.70/testrun/5965109/suite/kunit/tests/
> 
> Kunit Full test logs:
> https://lkft.validation.linaro.org/scheduler/job/3643324
> 
> https://qa-reports.linaro.org/lkft/linux-stable-rc-linux-5.10.y/build/v5.10.70/testrun/5965109/suite/kunit/test/kunit_log_test/log
> 
> 
> --
> Linaro LKFT
> https://lkft.linaro.org
> 




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