This patch allows a test cast to specify the number of runs to use. For
compatibility with existing test case definitions, the default value 0
is interpreted as MAX_TESTRUNS.
A reduced number of runs is useful for complex test programs where 1000
runs may take a very long time. Instead of reducing what is tested, one
can instead reduce the number of times the test is run.
Signed-off-by: Johan Almbladh <johan.almbladh@xxxxxxxxxxxxxxxxx>
---
lib/test_bpf.c | 4 ++++
1 file changed, 4 insertions(+)
diff --git a/lib/test_bpf.c b/lib/test_bpf.c
index 830a18ecffc8..c8bd3e9ab10a 100644
--- a/lib/test_bpf.c
+++ b/lib/test_bpf.c
@@ -80,6 +80,7 @@ struct bpf_test {
int expected_errcode; /* used when FLAG_EXPECTED_FAIL is set in the aux */
__u8 frag_data[MAX_DATA];
int stack_depth; /* for eBPF only, since tests don't call verifier */
+ int nr_testruns; /* Custom run count, defaults to MAX_TESTRUNS if 0 */
};
/* Large test cases need separate allocation and fill handler. */
@@ -8631,6 +8632,9 @@ static int run_one(const struct bpf_prog *fp, struct bpf_test *test)
{
int err_cnt = 0, i, runs = MAX_TESTRUNS;
+ if (test->nr_testruns)
+ runs = min(test->nr_testruns, MAX_TESTRUNS);
+
for (i = 0; i < MAX_SUBTESTS; i++) {
void *data;
u64 duration;
--
2.25.1
