This patch set adds a number of new tests to the test_bpf.ko test suite. The tests are intended to verify the correctness of eBPF JITs. In cases when it is feasible to test all possible values exhaustively, for example every legal ALU shift value, so is done. In other cases, a pattern of operand values that are likely to trigger different JIT code paths are tested. For example, instructions with two 64-bit operands are tested with every power-of-two value combination, with some small pertubations added. Some tests might seem a bit artificial. However this patch set, as well as my other recent additions to test suite, is essentially a bi-product of my work implementing a JIT for 32-bit MIPS. The tests exercise mechanisms and aspects that I encountered during JIT development, and that I found to be non-trivial to implement correctly. Johan Johan Almbladh (13): bpf/tests: Allow different number of runs per test case bpf/tests: Reduce memory footprint of test suite bpf/tests: Add exhaustive tests of ALU shift values bpf/tests: Add exhaustive tests of ALU operand magnitudes bpf/tests: Add exhaustive tests of JMP operand magnitudes bpf/tests: Add staggered JMP and JMP32 tests bpf/tests: Add exhaustive test of LD_IMM64 immediate magnitudes bpf/tests: Add test case flag for verifier zero-extension bpf/tests: Add JMP tests with small offsets bpf/tests: Add JMP tests with degenerate conditional bpf/tests: Expand branch conversion JIT test bpf/tests: Add more BPF_END byte order conversion tests bpf/tests: Add tail call limit test with external function call lib/test_bpf.c | 3314 +++++++++++++++++++++++++++++++++++++++++++++++- 1 file changed, 3272 insertions(+), 42 deletions(-) -- 2.25.1
