The patch below does not apply to the 6.1-stable tree. If someone wants it applied there, or to any other stable or longterm tree, then please email the backport, including the original git commit id to <stable@xxxxxxxxxxxxxxx>. To reproduce the conflict and resubmit, you may use the following commands: git fetch https://git.kernel.org/pub/scm/linux/kernel/git/stable/linux.git/ linux-6.1.y git checkout FETCH_HEAD git cherry-pick -x f42c97027fb75776e2e9358d16bf4a99aeb04cf2 # <resolve conflicts, build, test, etc.> git commit -s git send-email --to '<stable@xxxxxxxxxxxxxxx>' --in-reply-to '2024042941-payphone-elf-fac2@gregkh' --subject-prefix 'PATCH 6.1.y' HEAD^.. Possible dependencies: f42c97027fb7 ("eeprom: at24: fix memory corruption race condition") caba40ec3531 ("eeprom: at24: Probe for DDR3 thermal sensor in the SPD case") a3c10035d12f ("eeprom: at24: Use dev_err_probe for nvmem register failure") thanks, greg k-h ------------------ original commit in Linus's tree ------------------ >From f42c97027fb75776e2e9358d16bf4a99aeb04cf2 Mon Sep 17 00:00:00 2001 From: Daniel Okazaki <dtokazaki@xxxxxxxxxx> Date: Mon, 22 Apr 2024 17:43:36 +0000 Subject: [PATCH] eeprom: at24: fix memory corruption race condition If the eeprom is not accessible, an nvmem device will be registered, the read will fail, and the device will be torn down. If another driver accesses the nvmem device after the teardown, it will reference invalid memory. Move the failure point before registering the nvmem device. Signed-off-by: Daniel Okazaki <dtokazaki@xxxxxxxxxx> Fixes: b20eb4c1f026 ("eeprom: at24: drop unnecessary label") Cc: stable@xxxxxxxxxxxxxxx Link: https://lore.kernel.org/r/20240422174337.2487142-1-dtokazaki@xxxxxxxxxx Signed-off-by: Bartosz Golaszewski <bartosz.golaszewski@xxxxxxxxxx> diff --git a/drivers/misc/eeprom/at24.c b/drivers/misc/eeprom/at24.c index 572333ead5fb..4bd4f32bcdab 100644 --- a/drivers/misc/eeprom/at24.c +++ b/drivers/misc/eeprom/at24.c @@ -758,15 +758,6 @@ static int at24_probe(struct i2c_client *client) } pm_runtime_enable(dev); - at24->nvmem = devm_nvmem_register(dev, &nvmem_config); - if (IS_ERR(at24->nvmem)) { - pm_runtime_disable(dev); - if (!pm_runtime_status_suspended(dev)) - regulator_disable(at24->vcc_reg); - return dev_err_probe(dev, PTR_ERR(at24->nvmem), - "failed to register nvmem\n"); - } - /* * Perform a one-byte test read to verify that the chip is functional, * unless powering on the device is to be avoided during probe (i.e. @@ -782,6 +773,15 @@ static int at24_probe(struct i2c_client *client) } } + at24->nvmem = devm_nvmem_register(dev, &nvmem_config); + if (IS_ERR(at24->nvmem)) { + pm_runtime_disable(dev); + if (!pm_runtime_status_suspended(dev)) + regulator_disable(at24->vcc_reg); + return dev_err_probe(dev, PTR_ERR(at24->nvmem), + "failed to register nvmem\n"); + } + /* If this a SPD EEPROM, probe for DDR3 thermal sensor */ if (cdata == &at24_data_spd) at24_probe_temp_sensor(client);
