From: Jonathan Cameron <Jonathan.Cameron@xxxxxxxxxx>
[ Upstream commit 1efc41035f1841acf0af2bab153158e27ce94f10 ]
in_ only occurs once in these attributes.
Fixes: 0baf29d658c7 ("staging:iio:documentation Add abi docs for capacitance adcs.")
Signed-off-by: Jonathan Cameron <Jonathan.Cameron@xxxxxxxxxx>
Reviewed-by: Andy Shevchenko <andy.shevchenko@xxxxxxxxx>
Link: https://lore.kernel.org/r/20220626122938.582107-3-jic23@xxxxxxxxxx
Signed-off-by: Sasha Levin <sashal@xxxxxxxxxx>
---
Documentation/ABI/testing/sysfs-bus-iio | 2 +-
1 file changed, 1 insertion(+), 1 deletion(-)
diff --git a/Documentation/ABI/testing/sysfs-bus-iio b/Documentation/ABI/testing/sysfs-bus-iio
index e81ba6f5e1c8..6e1b925f30bf 100644
--- a/Documentation/ABI/testing/sysfs-bus-iio
+++ b/Documentation/ABI/testing/sysfs-bus-iio
@@ -196,7 +196,7 @@ Description:
Raw capacitance measurement from channel Y. Units after
application of scale and offset are nanofarads.
-What: /sys/.../iio:deviceX/in_capacitanceY-in_capacitanceZ_raw
+What: /sys/.../iio:deviceX/in_capacitanceY-capacitanceZ_raw
KernelVersion: 3.2
Contact: linux-iio@xxxxxxxxxxxxxxx
Description:
--
2.35.1
