Re: [PATCH v1 2/2] serial: Set probe_no_timeout for all DT based drivers

[Date Prev][Date Next][Thread Prev][Thread Next][Date Index][Thread Index]

 



On 2022-06-28 at 04:01:03 +0200, Saravana Kannan <saravanak@xxxxxxxxxx> wrote:
> diff --git a/drivers/tty/serial/8250/8250_acorn.c b/drivers/tty/serial/8250/8250_acorn.c
> index 758c4aa203ab..5a6f2f67de4f 100644
> --- a/drivers/tty/serial/8250/8250_acorn.c
> +++ b/drivers/tty/serial/8250/8250_acorn.c
> @@ -114,7 +114,6 @@ static const struct ecard_id serial_cids[] = {
>  static struct ecard_driver serial_card_driver = {
>  	.probe		= serial_card_probe,
>  	.remove		= serial_card_remove,
> -	.id_table	= serial_cids,

Is this change intentional? All other drivers are only changed to set
.probe_no_time and I don't see anything mentioned in the commit message
re. this driver's change.



[Index of Archives]     [Kernel Development]     [DCCP]     [Linux ARM Development]     [Linux]     [Photo]     [Yosemite Help]     [Linux ARM Kernel]     [Linux SCSI]     [Linux x86_64]     [Linux Hams]

  Powered by Linux