From: Darrick J. Wong <djwong@xxxxxxxxxx> Rework the feature detection in the one online fsck stress test so that we only format the scratch device twice per test run. Signed-off-by: Darrick J. Wong <djwong@xxxxxxxxxx> --- tests/xfs/422 | 3 ++- 1 file changed, 2 insertions(+), 1 deletion(-) diff --git a/tests/xfs/422 b/tests/xfs/422 index 0bf08572f3..b3353d2202 100755 --- a/tests/xfs/422 +++ b/tests/xfs/422 @@ -25,11 +25,12 @@ _register_cleanup "_cleanup" BUS # real QA test starts here _supported_fs xfs -_require_xfs_scratch_rmapbt +_require_scratch _require_xfs_stress_online_repair _scratch_mkfs > "$seqres.full" 2>&1 _scratch_mount +_require_xfs_has_feature "$SCRATCH_MNT" rmapbt _scratch_xfs_stress_online_repair # success, all done
