Re: [PATCH v10] lib: checksum: Use aligned accesses for ip_fast_csum and csum_ipv6_magic tests

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On 2/26/24 15:17, Charlie Jenkins wrote:
On Mon, Feb 26, 2024 at 10:33:56PM +0000, David Laight wrote:
I think you misunderstand. "NET_IP_ALIGN offset is what the kernel
defines to be supported" is a gross misinterpretation. It is not
"defined to be supported" at all. It is the _preferred_ alignment
nothing more, nothing less.

This distinction is arbitrary in practice, but I am open to being proven
wrong if you have data to back up this statement. If the driver chooses
to not follow this, then the driver might not work. ARM defines the
NET_IP_ALIGN to be 2 to pad out the header to be on the supported
alignment. If the driver chooses to pad with one byte instead of 2
bytes, the driver may fail to work as the CPU may stall after the
misaligned access.

I'm sure I've seen code that would realign IP headers to a 4 byte
boundary before processing them - but that might not have been in

I'm also sure there are cpu which will fault double length misaligned
memory transfers - which might be used to marginally speed up code.
Assuming more than 4 byte alignment for the IP header is likely
'wishful thinking'.

There is plenty of ethernet hardware that can only write frames
to even boundaries and plenty of cpu that fault misaligned accesses.
There are even cases of both on the same silicon die.

You also pretty much never want a fault handler to fixup misaligned
ethernet frames (or really anything else for that matter).
It is always going to be better to check in the code itself.

x86 has just made people 'sloppy' :-)


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If somebody has a solution they deem to be better, I am happy to change
this test case. Otherwise, I would appreciate a maintainer resolving
this discussion and apply this fix.


I do have a couple of patches which add explicit unaligned tests as well as
corner case tests (which are intended to trigger as many carry overflows
as possible). Once I get those working reliably, I'll be happy to submit
them as additional tests.


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