Re: [PATCH 11/15] mtd: rawnand: Use nanddev_mtd_max_bad_blocks()

[Schrempf Frieder <frieder.schrempf@xxxxxxxxxx>]

On 21.02.19 10:15, Miquel Raynal wrote:
> From: Boris Brezillon <bbrezillon@xxxxxxxxxx>
> 
> nanddev_mtd_max_bad_blocks() is implemented by the generic NAND layer
> and is already doing what we need. Reuse this function instead of
> having our own implementation.
> 
> While at it, get rid of the ->max_bb_per_die and ->blocks_per_die
> fields which are now unused.
> 
> Signed-off-by: Boris Brezillon <bbrezillon@xxxxxxxxxx>
> Signed-off-by: Miquel Raynal <miquel.raynal@xxxxxxxxxxx>

Reviewed-by: Frieder Schrempf <frieder.schrempf@xxxxxxxxxx>

> ---
>   drivers/mtd/nand/raw/nand_base.c | 38 +-------------------------------
>   drivers/mtd/nand/raw/nand_onfi.c |  3 ---
>   include/linux/mtd/rawnand.h      |  5 -----
>   3 files changed, 1 insertion(+), 45 deletions(-)
> 
> diff --git a/drivers/mtd/nand/raw/nand_base.c b/drivers/mtd/nand/raw/nand_base.c
> index 256d16903d54..4c9c2660df64 100644
> --- a/drivers/mtd/nand/raw/nand_base.c
> +++ b/drivers/mtd/nand/raw/nand_base.c
> @@ -4350,42 +4350,6 @@ static int nand_block_markbad(struct mtd_info *mtd, loff_t ofs)
>   	return nand_block_markbad_lowlevel(mtd_to_nand(mtd), ofs);
>   }
>   
> -/**
> - * nand_max_bad_blocks - [MTD Interface] Max number of bad blocks for an mtd
> - * @mtd: MTD device structure
> - * @ofs: offset relative to mtd start
> - * @len: length of mtd
> - */
> -static int nand_max_bad_blocks(struct mtd_info *mtd, loff_t ofs, size_t len)
> -{
> -	struct nand_chip *chip = mtd_to_nand(mtd);
> -	u32 part_start_block;
> -	u32 part_end_block;
> -	u32 part_start_die;
> -	u32 part_end_die;
> -
> -	/*
> -	 * max_bb_per_die and blocks_per_die used to determine
> -	 * the maximum bad block count.
> -	 */
> -	if (!chip->max_bb_per_die || !chip->blocks_per_die)
> -		return -ENOTSUPP;
> -
> -	/* Get the start and end of the partition in erase blocks. */
> -	part_start_block = mtd_div_by_eb(ofs, mtd);
> -	part_end_block = mtd_div_by_eb(len, mtd) + part_start_block - 1;
> -
> -	/* Get the start and end LUNs of the partition. */
> -	part_start_die = part_start_block / chip->blocks_per_die;
> -	part_end_die = part_end_block / chip->blocks_per_die;
> -
> -	/*
> -	 * Look up the bad blocks per unit and multiply by the number of units
> -	 * that the partition spans.
> -	 */
> -	return chip->max_bb_per_die * (part_end_die - part_start_die + 1);
> -}
> -
>   /**
>    * nand_suspend - [MTD Interface] Suspend the NAND flash
>    * @mtd: MTD device structure
> @@ -5854,7 +5818,7 @@ static int nand_scan_tail(struct nand_chip *chip)
>   	mtd->_block_isreserved = nand_block_isreserved;
>   	mtd->_block_isbad = nand_block_isbad;
>   	mtd->_block_markbad = nand_block_markbad;
> -	mtd->_max_bad_blocks = nand_max_bad_blocks;
> +	mtd->_max_bad_blocks = nanddev_mtd_max_bad_blocks;
>   
>   	/*
>   	 * Initialize bitflip_threshold to its default prior scan_bbt() call.
> diff --git a/drivers/mtd/nand/raw/nand_onfi.c b/drivers/mtd/nand/raw/nand_onfi.c
> index f3f59cf37d7f..3ca9c8923a30 100644
> --- a/drivers/mtd/nand/raw/nand_onfi.c
> +++ b/drivers/mtd/nand/raw/nand_onfi.c
> @@ -251,9 +251,6 @@ int nand_onfi_detect(struct nand_chip *chip)
>   	memorg->bits_per_cell = p->bits_per_cell;
>   	chip->bits_per_cell = p->bits_per_cell;
>   
> -	chip->max_bb_per_die = le16_to_cpu(p->bb_per_lun);
> -	chip->blocks_per_die = le32_to_cpu(p->blocks_per_lun);
> -
>   	if (le16_to_cpu(p->features) & ONFI_FEATURE_16_BIT_BUS)
>   		chip->options |= NAND_BUSWIDTH_16;
>   
> diff --git a/include/linux/mtd/rawnand.h b/include/linux/mtd/rawnand.h
> index 00a8795b215d..d748e09de480 100644
> --- a/include/linux/mtd/rawnand.h
> +++ b/include/linux/mtd/rawnand.h
> @@ -1027,9 +1027,6 @@ struct nand_legacy {
>    * @id:			[INTERN] holds NAND ID
>    * @parameters:		[INTERN] holds generic parameters under an easily
>    *			readable form.
> - * @max_bb_per_die:	[INTERN] the max number of bad blocks each die of a
> - *			this nand device will encounter their life times.
> - * @blocks_per_die:	[INTERN] The number of PEBs in a die
>    * @data_interface:	[INTERN] NAND interface timing information
>    * @cur_cs:		currently selected target. -1 means no target selected,
>    *			otherwise we should always have cur_cs >= 0 &&
> @@ -1085,8 +1082,6 @@ struct nand_chip {
>   
>   	struct nand_id id;
>   	struct nand_parameters parameters;
> -	u16 max_bb_per_die;
> -	u32 blocks_per_die;
>   
>   	struct nand_data_interface data_interface;
>   
> 
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