Hi All, This patch series adds support for BT.656 mode in the ov772x sensor and also enables color bar test pattern control. Cheers, Prabhakar V7->v8 * Fixed review comments pointed by Sakari v6->v7 * Fixed review comments pointed by Sakari * Included Ack from Jacopo v5->v6 * Introduced new function ov772x_parse_dt() * Moved the backward compatibility comment from 1/3 to 2/3 v4->v5: * Put the ep instance back using fwnode_handle_put() * Renamed BT656 to BT.656 * Correctly handled backward compatibility case falling back to parallel mode. v3->v4: * New patch 1/3 to fallback in parallel mode. * Switched to v4l2_fwnode_endpoint_alloc_parse() for parsing the ep. * Dropped support for pdat for test pattern control. * DT documentation patches [1]. v2->v3: * Dropped DT binding documentation patch as this is handled by Jacopo. * Fixed review comments pointed by Jacopo. v2: https://patchwork.kernel.org/project/linux-renesas-soc/ list/?series=328133 v1: https://patchwork.kernel.org/project/linux-renesas-soc/ list/?series=323807 [1] https://patchwork.kernel.org/project/ linux-renesas-soc/list/?series=346809 Lad Prabhakar (3): media: i2c: ov772x: Parse endpoint properties media: i2c: ov772x: Add support for BT.656 mode media: i2c: ov772x: Add test pattern control drivers/media/i2c/ov772x.c | 71 +++++++++++++++++++++++++++++++++++++- 1 file changed, 70 insertions(+), 1 deletion(-) -- 2.17.1
