Hi All, This patch series adds support for BT656 mode in the ov772x sensor and also enables color bar test pattern control. Cheers, Prabhakar Changes for v4: * New patch 1/3 to fallback in parallel mode. * Switched to v4l2_fwnode_endpoint_alloc_parse() for parsing the ep. * Dropped support for pdat for test pattern control. * DT documentation patches [1]. Changes for v3: * Dropped DT binding documentation patch as this is handled by Jacopo. * Fixed review comments pointed by Jacopo. [1] https://patchwork.kernel.org/project/linux-renesas-soc/list/?series=346809 Lad Prabhakar (3): media: i2c: ov772x: Parse endpoint properties media: i2c: ov772x: Add support for BT656 mode media: i2c: ov772x: Add test pattern control drivers/media/i2c/ov772x.c | 56 +++++++++++++++++++++++++++++++++++++- 1 file changed, 55 insertions(+), 1 deletion(-) -- 2.17.1
