This patch introduces a specific test case for the EVIOCGLED ioctl. The test covers the case where len > maxlen in the EVIOCGLED(sizeof(all_leds)), all_leds) ioctl. Signed-off-by: Dana Elfassy <dangel101@xxxxxxxxx> --- Changes in v2: - Changed variable leds from an array to an int This patch depends on '[v3] selftests/input: Introduce basic tests for evdev ioctls' [1] sent to the ML. [1] https://patchwork.kernel.org/project/linux-input/patch/20230607153214.15933-1-eballetbo@xxxxxxxxxx/ tools/testing/selftests/input/evioc-test.c | 17 +++++++++++++++++ 1 file changed, 17 insertions(+) diff --git a/tools/testing/selftests/input/evioc-test.c b/tools/testing/selftests/input/evioc-test.c index ad7b93fe39cf..378db2b4dd56 100644 --- a/tools/testing/selftests/input/evioc-test.c +++ b/tools/testing/selftests/input/evioc-test.c @@ -234,4 +234,21 @@ TEST(eviocsrep_set_repeat_settings) selftest_uinput_destroy(uidev); } +TEST(eviocgled_get_all_leds) +{ + struct selftest_uinput *uidev; + int leds = 0; + int rc; + + rc = selftest_uinput_create_device(&uidev, -1); + ASSERT_EQ(0, rc); + ASSERT_NE(NULL, uidev); + + /* ioctl to set the maxlen = 0 */ + rc = ioctl(uidev->evdev_fd, EVIOCGLED(0), leds); + ASSERT_EQ(0, rc); + + selftest_uinput_destroy(uidev); +} + TEST_HARNESS_MAIN -- 2.41.0
