Re: [PATCH v5 1/2] dt-bindings: iio: adc: adding support for PAC193X

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Hi,

kernel test robot noticed the following build warnings:

[auto build test WARNING on b1a1eaf6183697b77f7243780a25f35c7c0c8bdf]

url:    https://github.com/intel-lab-lkp/linux/commits/marius-cristea-microchip-com/dt-bindings-iio-adc-adding-support-for-PAC193X/20240223-004332
base:   b1a1eaf6183697b77f7243780a25f35c7c0c8bdf
patch link:    https://lore.kernel.org/r/20240222164206.65700-2-marius.cristea%40microchip.com
patch subject: [PATCH v5 1/2] dt-bindings: iio: adc: adding support for PAC193X
compiler: loongarch64-linux-gcc (GCC) 13.2.0
reproduce: (https://download.01.org/0day-ci/archive/20240224/202402241545.xf7CnlPz-lkp@xxxxxxxxx/reproduce)

If you fix the issue in a separate patch/commit (i.e. not just a new version of
the same patch/commit), kindly add following tags
| Reported-by: kernel test robot <lkp@xxxxxxxxx>
| Closes: https://lore.kernel.org/oe-kbuild-all/202402241545.xf7CnlPz-lkp@xxxxxxxxx/

dtcheck warnings: (new ones prefixed by >>)
>> Documentation/devicetree/bindings/iio/adc/microchip,pac1934.yaml:51:9: [warning] wrong indentation: expected 6 but found 8 (indentation)

vim +51 Documentation/devicetree/bindings/iio/adc/microchip,pac1934.yaml

     8	
     9	maintainers:
    10	  - Marius Cristea <marius.cristea@xxxxxxxxxxxxx>
    11	
    12	description: |
    13	  This device is part of the Microchip family of Power Monitors with
    14	  Accumulator.
    15	  The datasheet for PAC1931, PAC1932, PAC1933 and PAC1934 can be found here:
    16	    https://ww1.microchip.com/downloads/aemDocuments/documents/OTH/ProductDocuments/DataSheets/PAC1931-Family-Data-Sheet-DS20005850E.pdf
    17	
    18	properties:
    19	  compatible:
    20	    enum:
    21	      - microchip,pac1931
    22	      - microchip,pac1932
    23	      - microchip,pac1933
    24	      - microchip,pac1934
    25	
    26	  reg:
    27	    maxItems: 1
    28	
    29	  "#address-cells":
    30	    const: 1
    31	
    32	  "#size-cells":
    33	    const: 0
    34	
    35	  interrupts:
    36	    maxItems: 1
    37	
    38	  slow-io-gpios:
    39	    description:
    40	      A GPIO used to trigger a change is sampling rate (lowering the chip power
    41	      consumption). If configured in SLOW mode, if this pin is forced high,
    42	      sampling rate is forced to eight samples/second. When it is forced low,
    43	      the sampling rate is 1024 samples/second unless a different sample rate
    44	      has been programmed.
    45	
    46	patternProperties:
    47	  "^channel@[1-4]+$":
    48	    type: object
    49	    $ref: adc.yaml
    50	    description:
  > 51	        Represents the external channels which are connected to the ADC.
    52	
    53	    properties:
    54	      reg:
    55	        items:
    56	          minimum: 1
    57	          maximum: 4
    58	
    59	      shunt-resistor-micro-ohms:
    60	        description:
    61	          Value in micro Ohms of the shunt resistor connected between
    62	          the SENSE+ and SENSE- inputs, across which the current is measured.
    63	          Value is needed to compute the scaling of the measured current.
    64	
    65	    required:
    66	      - reg
    67	      - shunt-resistor-micro-ohms
    68	
    69	    unevaluatedProperties: false
    70	
    71	required:
    72	  - compatible
    73	  - reg
    74	  - "#address-cells"
    75	  - "#size-cells"
    76	

-- 
0-DAY CI Kernel Test Service
https://github.com/intel/lkp-tests/wiki




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