Problem: adm1272 and adm1278 supports temperature sampling. The current way of enabling it requires the user manually unbind the device from the driver, flip the temperature sampling control bit and then bind the device back to the driver. It would be nice if we can control this in a better way by reading the dt. Solution: Introducing device tree binding analog-temperature1-enable. If the flag is set, flip the temp1_en control bit on probing. Testing: make dt_binding_check Signed-off-by: Chu Lin <linchuyuan@xxxxxxxxxx> --- ChangeLog v1->v2: - Rename adm1272-adm1278-temp1-en to analog-temperature1-enable Documentation/devicetree/bindings/hwmon/adm1275.txt | 3 +++ 1 file changed, 3 insertions(+) diff --git a/Documentation/devicetree/bindings/hwmon/adm1275.txt b/Documentation/devicetree/bindings/hwmon/adm1275.txt index 1ecd03f3da4d..7a345c7794a2 100644 --- a/Documentation/devicetree/bindings/hwmon/adm1275.txt +++ b/Documentation/devicetree/bindings/hwmon/adm1275.txt @@ -15,6 +15,8 @@ Optional properties: - shunt-resistor-micro-ohms Shunt resistor value in micro-Ohm +- analog-temperature1-enable + Enable temperature sampling. This is supported on adm1272 and adm1278 Example: @@ -22,4 +24,5 @@ adm1272@10 { compatible = "adi,adm1272"; reg = <0x10>; shunt-resistor-micro-ohms = <500>; + analog-temperature1-enable; }; -- 2.28.0.rc0.105.gf9edc3c819-goog