[gpio:enable-compile-test 19/61] gpio-mc9s08dz60.c:undefined reference to `i2c_smbus_read_byte_data'

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tree:   https://git.kernel.org/pub/scm/linux/kernel/git/linusw/linux-gpio.git enable-compile-test
head:   b224eff5e8e4c028e54cbf00396d3839e7b3d028
commit: 9f7b567d955afdcf70cfabfc33e43ffa6a16d7dd [19/61] gpio: mc9s08dz60: Allow compile testing
config: sparc64-allmodconfig (attached as .config)
compiler: sparc64-linux-gnu-gcc (Debian 5.3.1-8) 5.3.1 20160205
reproduce:
        wget https://git.kernel.org/cgit/linux/kernel/git/wfg/lkp-tests.git/plain/sbin/make.cross -O ~/bin/make.cross
        chmod +x ~/bin/make.cross
        git checkout 9f7b567d955afdcf70cfabfc33e43ffa6a16d7dd
        # save the attached .config to linux build tree
        make.cross ARCH=sparc64 

Note: the gpio/enable-compile-test HEAD b224eff5e8e4c028e54cbf00396d3839e7b3d028 builds fine.
      It only hurts bisectibility.

All errors (new ones prefixed by >>):

---
0-DAY kernel test infrastructure                Open Source Technology Center
https://lists.01.org/pipermail/kbuild-all                   Intel Corporation

Attachment: .config.gz
Description: Binary data


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