Re: [Bisect] ext4_validate_inode_bitmap:98: comm stress-ng: Corrupt inode bitmap

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On Tue, Jul 10, 2018 at 10:51:43AM -0600, dann frazier wrote:
> On Sat, Jul 07, 2018 at 12:10:18AM -0400, Theodore Y. Ts'o wrote:
> > On Fri, Jul 06, 2018 at 11:43:24AM -0600, dann frazier wrote:
> > > Hi,
> > >   We're seeing a regression triggered by the stress-ng[*] "chdir" test
> > > that I've bisected to:
> > > 
> > > 044e6e3d74a3 ext4: don't update checksum of new initialized bitmaps
> > > 
> > > So far we've only seen failures on servers based on HiSilicon's family
> > > of ARM64 SoCs (D05/Hi1616 SoC, D06/Hi1620 SoC). On these systems it is
> > > very reproducible.
> > 
> > Thanks for the report.  Can you verify whether or not this patch fixes
> > things for you?
> 
> hey Ted,
>   Sorry for the delayed response - was afk for a long weekend.
> Your patch does seem to fix the issue for me - after applying the
> patch, I was able to survive 20 iterations (and counting), where
> previously it would always fail the first time.
> 
> However, I've received a conflicting report from a colleague who
> appears to still be seeing errors. I'll get back to you ASAP once I am
> able to (in-?)validate that observation.

OK - I believe I found an explanation for my colleague's continued
test failures after applying the patch. The filesystem being used may
have already been corrupted from a previous run, and the test w/ your
patch just tripped over it. Details are here starting in comment #9 if
you'd like to look them over:

  https://bugs.launchpad.net/ubuntu/+source/linux/+bug/1780137

  -dann



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