Okay, finally had some time to dismantle the machine in question and
inserted the backup drive without the enclosure. Now that I was able to get
smartctl to give me information on what was going on, it seems there's
nothing wrong with the drive itself (no remapped sectors, nothing prefail or
fail going wrong, drive's smart status is good) but it's had a history of
406 (!!!) errors reported, the last five happening within the same second,
all of which seem (to my untrained eye) to imply a bad IDE cable. Which
means likely my USB enclosure is screwing up.
To be sure, I did some extended testing with it hooked up: Tried
doing a full and incremental backup of my machine with no errors reported,
as well as an offline and then immediately afterwards, long test via
smartctl. Nothing changed in the output.
I've attached the output of smartctl at various points in the tests:
the first being the initial immediate display of information at startup, the
second just after the long test, and the third just after the two backups
(Full and incremental) were tried. Nothing seems to shout at me in the
output, I'm frankly pretty sure something's wrong with the enclosure. If
it's the drive, it's not showing up here at least.
I'd like your thoughts and suggestions on this. While I'm pretty
sure I know what the smartctl output means, I'm always capable of being
entirely wrong. Please let me know if I've misinterpreted the information.
Timothy McGrath
smartctl version 5.38 [i486-slackware-linux-gnu] Copyright (C) 2002-8 Bruce Allen
Home page is http://smartmontools.sourceforge.net/
=== START OF INFORMATION SECTION ===
Model Family: Seagate Barracuda 7200.8 family
Device Model: ST3250823A
Serial Number: 5ND3CC5A
Firmware Version: 3.06
User Capacity: 250,059,350,016 bytes
Device is: In smartctl database [for details use: -P show]
ATA Version is: 7
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is: Mon Nov 23 00:23:54 2009 EST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 430) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 84) minutes.
SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 074 036 006 Pre-fail Always - 50613791
3 Spin_Up_Time 0x0003 099 098 000 Pre-fail Always - 0
4 Start_Stop_Count 0x0032 100 100 020 Old_age Always - 112
5 Reallocated_Sector_Ct 0x0033 100 100 036 Pre-fail Always - 0
7 Seek_Error_Rate 0x000f 050 047 030 Pre-fail Always - 1443141758905
9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 354
10 Spin_Retry_Count 0x0013 100 100 097 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 020 Old_age Always - 157
194 Temperature_Celsius 0x0022 027 052 000 Old_age Always - 27 (0 19 0 0)
195 Hardware_ECC_Recovered 0x001a 051 046 000 Old_age Always - 760201
197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x0000 100 253 000 Old_age Offline - 0
202 TA_Increase_Count 0x0032 100 253 000 Old_age Always - 0
SMART Error Log Version: 1
ATA Error Count: 406 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 406 occurred at disk power-on lifetime: 160 hours (6 days + 16 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 01 07 00 00 e0 Error: ICRC, ABRT 1 sectors at LBA = 0x00000007 = 7
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 03 08 00 00 00 e0 00 00:00:36.934 READ DMA
c8 03 08 00 00 00 e0 00 00:00:36.511 READ DMA
c8 03 08 00 00 00 e0 00 00:00:36.087 READ DMA
c8 03 08 00 00 00 e0 00 00:00:35.663 READ DMA
c8 03 08 00 00 00 e0 00 00:00:35.240 READ DMA
Error 405 occurred at disk power-on lifetime: 160 hours (6 days + 16 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 01 07 00 00 e0 Error: ICRC, ABRT 1 sectors at LBA = 0x00000007 = 7
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 03 08 00 00 00 e0 00 00:00:36.934 READ DMA
c8 03 08 00 00 00 e0 00 00:00:36.511 READ DMA
c8 03 08 00 00 00 e0 00 00:00:36.087 READ DMA
c8 03 08 00 00 00 e0 00 00:00:35.663 READ DMA
c8 03 08 00 00 00 e0 00 00:00:35.240 READ DMA
Error 404 occurred at disk power-on lifetime: 160 hours (6 days + 16 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 01 07 00 00 e0 Error: ICRC, ABRT 1 sectors at LBA = 0x00000007 = 7
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 03 08 00 00 00 e0 00 00:00:36.934 READ DMA
c8 03 08 00 00 00 e0 00 00:00:36.511 READ DMA
c8 03 08 00 00 00 e0 00 00:00:36.087 READ DMA
c8 03 08 00 00 00 e0 00 00:00:35.663 READ DMA
c8 03 08 00 00 00 e0 00 00:00:35.240 READ DMA
Error 403 occurred at disk power-on lifetime: 160 hours (6 days + 16 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 01 07 00 00 e0 Error: ICRC, ABRT 1 sectors at LBA = 0x00000007 = 7
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 03 08 00 00 00 e0 00 00:00:36.934 READ DMA
c8 03 08 00 00 00 e0 00 00:00:36.511 READ DMA
c8 03 08 00 00 00 e0 00 00:00:36.087 READ DMA
c8 03 08 00 00 00 e0 00 00:00:35.663 READ DMA
c8 03 08 00 00 00 e0 00 00:00:35.240 READ DMA
Error 402 occurred at disk power-on lifetime: 160 hours (6 days + 16 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 01 07 00 00 e0 Error: ICRC, ABRT 1 sectors at LBA = 0x00000007 = 7
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 03 08 00 00 00 e0 00 00:00:30.579 READ DMA
c8 03 08 00 00 00 e0 00 00:00:36.511 READ DMA
c8 03 08 00 00 00 e0 00 00:00:36.087 READ DMA
c8 03 08 00 00 00 e0 00 00:00:35.663 READ DMA
c8 03 08 00 00 00 e0 00 00:00:35.240 READ DMA
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
smartctl version 5.38 [i486-slackware-linux-gnu] Copyright (C) 2002-8 Bruce Allen
Home page is http://smartmontools.sourceforge.net/
=== START OF INFORMATION SECTION ===
Model Family: Seagate Barracuda 7200.8 family
Device Model: ST3250823A
Serial Number: 5ND3CC5A
Firmware Version: 3.06
User Capacity: 250,059,350,016 bytes
Device is: In smartctl database [for details use: -P show]
ATA Version is: 7
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is: Mon Nov 23 02:37:01 2009 EST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 430) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 84) minutes.
SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 053 036 006 Pre-fail Always - 73989115
3 Spin_Up_Time 0x0003 099 098 000 Pre-fail Always - 0
4 Start_Stop_Count 0x0032 100 100 020 Old_age Always - 112
5 Reallocated_Sector_Ct 0x0033 100 100 036 Pre-fail Always - 0
7 Seek_Error_Rate 0x000f 050 047 030 Pre-fail Always - 1443142340790
9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 357
10 Spin_Retry_Count 0x0013 100 100 097 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 020 Old_age Always - 157
194 Temperature_Celsius 0x0022 040 052 000 Old_age Always - 40 (0 19 0 0)
195 Hardware_ECC_Recovered 0x001a 050 046 000 Old_age Always - 33250523
197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x0000 100 253 000 Old_age Offline - 0
202 TA_Increase_Count 0x0032 100 253 000 Old_age Always - 0
SMART Error Log Version: 1
ATA Error Count: 406 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 406 occurred at disk power-on lifetime: 160 hours (6 days + 16 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 01 07 00 00 e0 Error: ICRC, ABRT 1 sectors at LBA = 0x00000007 = 7
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 03 08 00 00 00 e0 00 00:00:36.934 READ DMA
c8 03 08 00 00 00 e0 00 00:00:36.511 READ DMA
c8 03 08 00 00 00 e0 00 00:00:36.087 READ DMA
c8 03 08 00 00 00 e0 00 00:00:35.663 READ DMA
c8 03 08 00 00 00 e0 00 00:00:35.240 READ DMA
Error 405 occurred at disk power-on lifetime: 160 hours (6 days + 16 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 01 07 00 00 e0 Error: ICRC, ABRT 1 sectors at LBA = 0x00000007 = 7
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 03 08 00 00 00 e0 00 00:00:36.934 READ DMA
c8 03 08 00 00 00 e0 00 00:00:36.511 READ DMA
c8 03 08 00 00 00 e0 00 00:00:36.087 READ DMA
c8 03 08 00 00 00 e0 00 00:00:35.663 READ DMA
c8 03 08 00 00 00 e0 00 00:00:35.240 READ DMA
Error 404 occurred at disk power-on lifetime: 160 hours (6 days + 16 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 01 07 00 00 e0 Error: ICRC, ABRT 1 sectors at LBA = 0x00000007 = 7
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 03 08 00 00 00 e0 00 00:00:36.934 READ DMA
c8 03 08 00 00 00 e0 00 00:00:36.511 READ DMA
c8 03 08 00 00 00 e0 00 00:00:36.087 READ DMA
c8 03 08 00 00 00 e0 00 00:00:35.663 READ DMA
c8 03 08 00 00 00 e0 00 00:00:35.240 READ DMA
Error 403 occurred at disk power-on lifetime: 160 hours (6 days + 16 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 01 07 00 00 e0 Error: ICRC, ABRT 1 sectors at LBA = 0x00000007 = 7
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 03 08 00 00 00 e0 00 00:00:36.934 READ DMA
c8 03 08 00 00 00 e0 00 00:00:36.511 READ DMA
c8 03 08 00 00 00 e0 00 00:00:36.087 READ DMA
c8 03 08 00 00 00 e0 00 00:00:35.663 READ DMA
c8 03 08 00 00 00 e0 00 00:00:35.240 READ DMA
Error 402 occurred at disk power-on lifetime: 160 hours (6 days + 16 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 01 07 00 00 e0 Error: ICRC, ABRT 1 sectors at LBA = 0x00000007 = 7
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 03 08 00 00 00 e0 00 00:00:30.579 READ DMA
c8 03 08 00 00 00 e0 00 00:00:36.511 READ DMA
c8 03 08 00 00 00 e0 00 00:00:36.087 READ DMA
c8 03 08 00 00 00 e0 00 00:00:35.663 READ DMA
c8 03 08 00 00 00 e0 00 00:00:35.240 READ DMA
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended captive Completed without error 00% 356 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
smartctl version 5.38 [i486-slackware-linux-gnu] Copyright (C) 2002-8 Bruce Allen
Home page is http://smartmontools.sourceforge.net/
=== START OF INFORMATION SECTION ===
Model Family: Seagate Barracuda 7200.8 family
Device Model: ST3250823A
Serial Number: 5ND3CC5A
Firmware Version: 3.06
User Capacity: 250,059,350,016 bytes
Device is: In smartctl database [for details use: -P show]
ATA Version is: 7
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is: Mon Nov 23 02:42:34 2009 EST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 430) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 84) minutes.
SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 051 036 006 Pre-fail Always - 72983290
3 Spin_Up_Time 0x0003 099 098 000 Pre-fail Always - 0
4 Start_Stop_Count 0x0032 100 100 020 Old_age Always - 112
5 Reallocated_Sector_Ct 0x0033 100 100 036 Pre-fail Always - 0
7 Seek_Error_Rate 0x000f 050 047 030 Pre-fail Always - 1443142359378
9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 357
10 Spin_Retry_Count 0x0013 100 100 097 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 020 Old_age Always - 157
194 Temperature_Celsius 0x0022 040 052 000 Old_age Always - 40 (0 19 0 0)
195 Hardware_ECC_Recovered 0x001a 049 046 000 Old_age Always - 48607152
197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x0000 100 253 000 Old_age Offline - 0
202 TA_Increase_Count 0x0032 100 253 000 Old_age Always - 0
SMART Error Log Version: 1
ATA Error Count: 406 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 406 occurred at disk power-on lifetime: 160 hours (6 days + 16 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 01 07 00 00 e0 Error: ICRC, ABRT 1 sectors at LBA = 0x00000007 = 7
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 03 08 00 00 00 e0 00 00:00:36.934 READ DMA
c8 03 08 00 00 00 e0 00 00:00:36.511 READ DMA
c8 03 08 00 00 00 e0 00 00:00:36.087 READ DMA
c8 03 08 00 00 00 e0 00 00:00:35.663 READ DMA
c8 03 08 00 00 00 e0 00 00:00:35.240 READ DMA
Error 405 occurred at disk power-on lifetime: 160 hours (6 days + 16 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 01 07 00 00 e0 Error: ICRC, ABRT 1 sectors at LBA = 0x00000007 = 7
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 03 08 00 00 00 e0 00 00:00:36.934 READ DMA
c8 03 08 00 00 00 e0 00 00:00:36.511 READ DMA
c8 03 08 00 00 00 e0 00 00:00:36.087 READ DMA
c8 03 08 00 00 00 e0 00 00:00:35.663 READ DMA
c8 03 08 00 00 00 e0 00 00:00:35.240 READ DMA
Error 404 occurred at disk power-on lifetime: 160 hours (6 days + 16 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 01 07 00 00 e0 Error: ICRC, ABRT 1 sectors at LBA = 0x00000007 = 7
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 03 08 00 00 00 e0 00 00:00:36.934 READ DMA
c8 03 08 00 00 00 e0 00 00:00:36.511 READ DMA
c8 03 08 00 00 00 e0 00 00:00:36.087 READ DMA
c8 03 08 00 00 00 e0 00 00:00:35.663 READ DMA
c8 03 08 00 00 00 e0 00 00:00:35.240 READ DMA
Error 403 occurred at disk power-on lifetime: 160 hours (6 days + 16 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 01 07 00 00 e0 Error: ICRC, ABRT 1 sectors at LBA = 0x00000007 = 7
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 03 08 00 00 00 e0 00 00:00:36.934 READ DMA
c8 03 08 00 00 00 e0 00 00:00:36.511 READ DMA
c8 03 08 00 00 00 e0 00 00:00:36.087 READ DMA
c8 03 08 00 00 00 e0 00 00:00:35.663 READ DMA
c8 03 08 00 00 00 e0 00 00:00:35.240 READ DMA
Error 402 occurred at disk power-on lifetime: 160 hours (6 days + 16 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 01 07 00 00 e0 Error: ICRC, ABRT 1 sectors at LBA = 0x00000007 = 7
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 03 08 00 00 00 e0 00 00:00:30.579 READ DMA
c8 03 08 00 00 00 e0 00 00:00:36.511 READ DMA
c8 03 08 00 00 00 e0 00 00:00:36.087 READ DMA
c8 03 08 00 00 00 e0 00 00:00:35.663 READ DMA
c8 03 08 00 00 00 e0 00 00:00:35.240 READ DMA
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended captive Completed without error 00% 356 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
