Add optional max expected current property which allows calibrating
the ina sensor in order to achieve requested measure scale. Document
the changes in Documentation/hwmon/ina2xx.
Signed-off-by: Maciej Purski <m.purski@xxxxxxxxxxx>
---
Documentation/devicetree/bindings/hwmon/ina2xx.txt | 4 +++-
Documentation/hwmon/ina2xx | 3 +++
2 files changed, 6 insertions(+), 1 deletion(-)
diff --git a/Documentation/devicetree/bindings/hwmon/ina2xx.txt b/Documentation/devicetree/bindings/hwmon/ina2xx.txt
index 02af0d9..49ef0be 100644
--- a/Documentation/devicetree/bindings/hwmon/ina2xx.txt
+++ b/Documentation/devicetree/bindings/hwmon/ina2xx.txt
@@ -14,11 +14,13 @@ Optional properties:
- shunt-resistor
Shunt resistor value in micro-Ohm
-
+- ti-max-expected-current-microamp
+ Max expected current value in mA
Example:
ina220@44 {
compatible = "ti,ina220";
reg = <0x44>;
shunt-resistor = <1000>;
+ ti-max-expected-current-microamp = <3000>;
};
diff --git a/Documentation/hwmon/ina2xx b/Documentation/hwmon/ina2xx
index cfd31d9..30620e8 100644
--- a/Documentation/hwmon/ina2xx
+++ b/Documentation/hwmon/ina2xx
@@ -55,6 +55,9 @@ The shunt value in micro-ohms can be set via platform data or device tree at
compile-time or via the shunt_resistor attribute in sysfs at run-time. Please
refer to the Documentation/devicetree/bindings/i2c/ina2xx.txt for bindings
if the device tree is used.
+The max expected current value in miliamp can be set via platform data
+or device tree at compile-time or via currX_max attribute in sysfs
+at run-time.
Additionally ina226 supports update_interval attribute as described in
Documentation/hwmon/sysfs-interface. Internally the interval is the sum of
--
2.7.4
--
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