tree: https://gitlab.freedesktop.org/drm/xe/kernel.git drm-xe-next head: b3890fb4386dcef68a96888141c4cc773f6241ce commit: 052cd881aa7a198a510bbbd94fd1859c497c75f8 [1709/1927] drm/xe/hwmon: Expose card reactive critical power reproduce: (https://download.01.org/0day-ci/archive/20231111/202311112157.QOcNbbvO-lkp@xxxxxxxxx/reproduce) If you fix the issue in a separate patch/commit (i.e. not just a new version of the same patch/commit), kindly add following tags | Reported-by: kernel test robot <lkp@xxxxxxxxx> | Closes: https://lore.kernel.org/oe-kbuild-all/202311112157.QOcNbbvO-lkp@xxxxxxxxx/ All warnings (new ones prefixed by >>): >> Warning: /sys/devices/.../hwmon/hwmon<i>/curr1_crit is defined 2 times: ./Documentation/ABI/testing/sysfs-driver-intel-xe-hwmon:35 ./Documentation/ABI/testing/sysfs-driver-intel-i915-hwmon:52 >> Warning: /sys/devices/.../hwmon/hwmon<i>/power1_crit is defined 2 times: ./Documentation/ABI/testing/sysfs-driver-intel-xe-hwmon:22 ./Documentation/ABI/testing/sysfs-driver-intel-i915-hwmon:39 -- 0-DAY CI Kernel Test Service https://github.com/intel/lkp-tests/wiki
